Author's Latest Posts


Same Chip, Two Destinies: How Power Profiles Improve With On-Chip Monitoring


What happens to critical power-related considerations when the same chip is handled two different ways, with or without visibility from within? This article begins by examining how the absence of on-chip monitoring impacts peak power, average power, and Di/Dt noise (rate of current change), as illustrated in the diagram below and the subsequent discussion. It then details how these aspects c... » read more

Extending Chip Lifetime With Safer Voltage Scaling


What if your chips lived 20% longer without compromising performance, and even while reducing power consumption? How would it affect your product’s reliability and cost? What would be the effect on your profitability? With the demand for longer-lasting chips growing across industries, designers and reliability engineers face increasing pressure to ensure their products perform correctly fo... » read more

Improving Reliability Monitoring Of High-Bandwidth Memory


As the quest for increased bandwidth and speed continues, multi-die technologies with advanced memory architectures are introduced. As the complexity of these heterogenous packaging continues to develop, new reliability challenges arise. A new approach to HBM subsystem monitoring and repair provides advanced in-field reliability assurance. By applying analytics to data created by on-chip Age... » read more