Author's Latest Posts

MIMO Application Framework
By NI - 12 Mar, 2024 - Comments: 0

Massive MIMO is an exciting area of 5G wireless research. For next-generation wireless data networks, it promises significant gains that offer the ability to accommodate more users at higher data rates with better reliability while consuming less power. Using the NI Massive MIMO Software Architecture, researchers can build Massive MIMO testbeds to rapidly prototype large-scale antenna systems u... » read more

Application-Oriented Testing Of SiC Power Semiconductors
By NI - 09 Jan, 2024 - Comments: 0

SiC (silicon carbide) has established itself as an important material in the semiconductor market because it has many outstanding properties. In comparison with silicon, SiC offers a higher electrical breakdown voltage, resulting in improved component performance and efficiency. It also allows for operation at higher temperatures, which makes heat dissipation easier and enables improved perform... » read more

Introduction To The NI mmWave Transceiver System Hardware
By NI - 10 Feb, 2020 - Comments: 0

Wireless technology is everywhere. Every day more and more new wireless devices are being created and accessing today’s wireless networks, consuming more and more data. The number of new wireless devices continues to escalate and the amount of data consumed continues to grow at an exponential rate. In order to address the demand, new wireless technologies are being investigated to evolve the ... » read more

Advanced Features Of High-Speed Digital I/O Devices: Timing
By NI - 14 Jan, 2020 - Comments: 0

In digital communication, timing is the most essential element. Any kind of violation to timing could cause you to transmit or receive incorrect data. As instruments and communication rates get faster, timing becomes even more vital, as even the smallest of changes in edges (in the pico-second range), could cause incorrect tests and communication failures. In the following paragraphs, discover ... » read more

Six Things You Need To Know About USB Instrument Control
By NI - 09 Dec, 2019 - Comments: 0

With plug-and-play connectivity and the near ubiquity of USB ports on modern PCs and laptops, USB has become a popular choice for controlling stand-alone instrumentation. As more instrument manufacturers begin to include USB ports on their devices, it is important to understand several issues surrounding USB to ensure the longevity of your test system. To read more, click here. » read more

Selecting an Approach to Build Flexible, Cost-Effective ECU Production Test Systems
By NI - 11 Nov, 2019 - Comments: 0

Electronic control units (ECUs) were invented in the 1970s. At that time, people needed to improve fuel economy due to the oil crisis, which meant finding a way to make engines run cleaner and pollute less. Engines used a mechanical device called a distributor to control spark timing and a carburetor to control the fuel mixture. This mechanical system had minimal tuning and adjustment capabilit... » read more

Advanced Features Of High-Speed Digital I/O Devices: Data Delay
By NI - 07 Oct, 2019 - Comments: 0

In high speed digital communications, because of factors such as setup time and hold time, it might be important to delay the data from the edge of the clock. The different settings and parameters that affect data delay are discussed in this white paper. To read more, click here. » read more

Under The Hood Of NI Linux Real-Time
By NI - 09 Sep, 2019 - Comments: 0

The NI LabVIEW Real-Time Module supports the NI Linux Real-Time OS, available on select NI hardware. In this article, learn about specific new features and advanced topics to get the most out of NI Linux Real-Time for your application. To read more, click here. » read more

Advanced Features Of High-Speed Digital I/O devices: Hardware Compare
By NI - 05 Aug, 2019 - Comments: 0

This paper describes how to use Hardware compare on the NI-HSDIO devices. The hardware compare feature allows users to perform digital comparisons of data on device itself. This allows for real time hardware comparison, which is not possible if data is transferred back to the host computer. This allows for tests such as Bit Error Rate Testing (BERT) and digital waveform comparisons. To read ... » read more

Advanced Features Of High Speed Digital I/O Devices: Double Data Rate
By NI - 08 Jul, 2019 - Comments: 0

As clock speeds and data rates continue to increase, designers of digital integrated circuits are creating new ways to maximize the rate of data being sent into and out of digital devices. One such method is known as double data rate (DDR). With single data rate (SDR) devices, data is latched on either the rising or falling edges of the sample clock. A DDR device latches data on both the rising... » read more

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