Nick Keller

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Nick Keller is a senior technologist in corporate marketing and primarily supports strategic programs and new product introduction at Onto Innovation. Keller has been working in semiconductor metrology for over 14 years in various roles at Onto Innovation and Nanometrics, and holds a BSEE from UCSB.

Author's Latest Posts

3D NAND Needs 3D Metrology

By Nick Keller - 08 Aug, 2023 - Comments: 0

By Nick Keller and Andy Antonelli You’ve read the reports: the memory market is floundering as the semiconductor industry moves through another scarcity/surplus cycle. Be that as it may, innovation is happening as the industry continues to pursue increasingly higher three-dimensional stacks, with 3D NAND stacks taller than 200 layers entering production. However, there are challenges... » read more

Critical Moves: Advanced Logic Devices And CIS Benefit From Applications Using IRCD Metrology

By Nick Keller - 08 Feb, 2022 - Comments: 1

As 3D NAND continues to scale vertically — all in the name of increasing capacity and speed and reducing inefficiency and cost — maintaining channel hole critical dimension (CD) and shape uniformity becomes even more challenging. Faced with rising high-aspect ratios, addressing these challenges requires new inline non-destructive metrology to provide real-time process control. Infrared crit... » read more