中文 English

Author's Latest Posts


Managing Worst Case Power Conditions


With each new technology node, especially FinFET, the dynamic conditions within a chip are changing and becoming more complex in terms of process speeds, thermal activity and supply variation. Dennard scaling brought about the ability for power to be scaled down with each successive node so that power per unit area stayed roughly constant. However, as highlighted by John Hennessy at last y... » read more

Monitoring For In-Die Process Speed Detection


Chip designers working on advanced nodes typically include a fabric of sensors spread across the die for a number of very specific reasons. In this, the second of a three-part blog series, we explore some of the key applications and benefits of these types of sensing solutions. In this installment, the focus is In-Die Process Speed Detection and why understanding in-chip process speed detecti... » read more

Benefits Of In-Chip Thermal Sensing


The latest SoCs on advanced semiconductor nodes typically include a fabric of sensors spread across the die, and for good reason. But why and what are the benefits? This first blog of a three-part series explores some of the key applications for in-chip thermal sensing and why embedding in-chip monitoring IP is an essential step to maximize performance and reliability and minimize power, or a... » read more