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Modulated Electron Microscopy Applied In The Process Monitoring Of Memory Cell And The Defect Inspection Of Floating Circuits
By Technical Paper Link - 07 Nov, 2023 - Comments: 0

A technical paper titled “In situ electrical property quantification of memory devices by modulated electron microscopy” was published by researchers at Hitachi High-Tech Corporation, KIOXIA Corporation, and Western Digital. Abstract: "E-beam inspection based on voltage-contrast (VC) defect metrology has been widely utilized for failure mode analysis of memory devices. Variation in e-beam... » read more

Discrete Noise Approximation When Modeling The Effects Of Noise On Quantum Circuits
By Technical Paper Link - 07 Nov, 2023 - Comments: 0

A technical paper titled “The Discrete Noise Approximation in Quantum Circuits” was published by researchers at HQS Quantum Simulations. Abstract: "When modeling the effects of noise on quantum circuits, one often makes the assumption that these effects can be accounted for by individual decoherence events following an otherwise noise-free gate. In this work, we address the validity of th... » read more

A Survey Of Recent Advances And Research Activities In Wireless NoC Security
By Technical Paper Link - 07 Nov, 2023 - Comments: 0

A technical paper titled “Wireless Network-on-Chip Security Review: Attack Taxonomy, Implications, and Countermeasures” was published by researchers at Macquarie University (Sydney). Abstract: "Network-on-chip (NoC) is a critical on-chip communication framework that underpins high-performance multicore computing and network system architectures. Its adoption has become widespread due to t... » read more

Improving The Retention Characteristics Of 3D NAND Flash Memories
By Technical Paper Link - 31 Oct, 2023 - Comments: 0

A technical paper titled “3D NAND Flash Memory Cell Current and Interference Characteristics Improvement With Multiple Dielectric Spacer” was published by researchers at Myongji University, Soongsil University, and Seoul National University. Abstract: "To achieve high density, the spacer length of three dimensional (3D) NAND device has been scaled down. When the program/erase cycle repeat... » read more

A New Architecture And Verification Approach For Hardware Security Modules
By Technical Paper Link - 31 Oct, 2023 - Comments: 0

A technical paper titled “The K2 Architecture for Trustworthy Hardware Security Modules” was published by researchers at MIT Computer Science and Artificial Intelligence Laboratory (CSAIL) and New York University. Abstract: "K2 is a new architecture and verification approach for hardware security modules (HSMs). The K2 architecture's rigid separation between I/O, storage, and computation ... » read more

Potentials And Issues Of Designing Fault-Tolerant Hardware Acceleration For Edge-Computing Devices
By Technical Paper Link - 31 Oct, 2023 - Comments: 0

A technical paper titled “Fault-Tolerant Hardware Acceleration for High-Performance Edge-Computing Nodes” was published by researchers at University of Rome. Abstract: "High-performance embedded systems with powerful processors, specialized hardware accelerators, and advanced software techniques are all key technologies driving the growth of the IoT. By combining hardware and software tec... » read more

A Modelling Approach To Well-Known And Exotic 2D Materials For Next-Gen FETs
By Technical Paper Link - 31 Oct, 2023 - Comments: 0

A technical paper titled “Field-Effect Transistors based on 2-D Materials: a Modeling Perspective” was published by researchers at ETH Zurich. Abstract: "Two-dimensional (2D) materials are particularly attractive to build the channel of next-generation field-effect transistors (FETs) with gate lengths below 10-15 nm. Because the 2D technology has not yet reached the same level of maturity... » read more

Benefits Of Using Wireless Communication Technologies In Power Electronics Systems Employing AGDs
By Technical Paper Link - 31 Oct, 2023 - Comments: 0

A technical paper titled “Wireless Control of Active Gate Drivers for Silicon Carbide power MOSFETs” was published by researchers at Norwegian University of Science and Technology (NTNU). Abstract: "Active Gate Drivers (AGDs) enhance controllability and monitoring of switching devices, especially for fast switching Silicon Carbide (SiC) power Metal-Oxide-Semiconductor Field-Effect Transis... » read more

CPU Fuzzing Via Intricate Program Generation (ETH Zurich)
By Technical Paper Link - 31 Oct, 2023 - Comments: 0

A technical paper titled “Cascade: CPU Fuzzing via Intricate Program Generation” was published by researchers at ETH Zurich. Abstract: "Generating interesting test cases for CPU fuzzing is akin to generating programs that exercise unusual states inside the CPU. The performance of CPU fuzzing is heavily influenced by the quality of these programs and by the overhead of bug detection. Our a... » read more

Light-Matter Interaction In Van Der Waals Nanophotonic Devices
By Technical Paper Link - 31 Oct, 2023 - Comments: 0

A technical paper titled “Deeply subwavelength integrated excitonic van der Waals nanophotonics” was published by researchers at University of California Los Angeles, University of Washington Seattle, and Auburn University. Abstract: "The wave nature of light sets a fundamental diffraction limit that challenges confinement and control of light in nanoscale structures with dimensions signi... » read more

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