Author's Latest Posts


Leveraging Vehicle-To-Everything Sidelink Communication For Relative Localization Of Connected Automated Vehicles 


A technical paper titled “V2X Sidelink Localization of Connected Automated Vehicles” was published by researchers at CNR-IEIIT and WiLabCNIT (Italy). Abstract: "Future automated driving relies on two pillars, (i) ultra-low-latency and reliable communications, and (ii) accurate positioning information. In particular, the knowledge of vehicle positions is becoming fundamental with the incre... » read more

A Framework To Detect Capacitance-Based Analog Hardware Trojans And Mitigate The Effects


A technical paper titled “DeMiST: Detection and Mitigation of Stealthy Analog Hardware Trojans” was published by researchers at Tennessee Tech University and Technische Universitat Wien. Abstract: "The global semiconductor supply chain involves design and fabrication at various locations, which leads to multiple security vulnerabilities, e.g., Hardware Trojan (HT) insertion. Although most... » read more

A Formal Verification Method To Detect Timing Side Channels In MCU SoCs


A technical paper titled “A New Security Threat in MCUs – SoC-wide timing side channels and how to find them” was published by researchers at University of Kaiserslautern-Landau and Stanford University. Abstract: "Microarchitectural timing side channels have been thoroughly investigated as a security threat in hardware designs featuring shared buffers (e.g., caches) and/or parallelism b... » read more

CMOS Compatible Materials With Quantum Defects Suitable For Room Temperature Applications


A technical paper titled “Thin Film Materials for Room Temperature Quantum Applications” was published by researchers at Marquette University. Abstract: "Thin films with quantum defects are emerging as a potential platform for quantum applications. Quantum defects in some thin films arise due to structural imperfections, such as vacancies or impurities. These defects generate localized el... » read more

Fabless Approach To Embed Active Nanophotonics in Bulk CMOS By Co-Designing The BEOL Layers For Optical Functionality (MIT)


A technical paper titled “Metal-Optic Nanophotonic Modulators in Standard CMOS Technology” was published by researchers at Massachusetts Institute of Technology. Abstract: "Integrating nanophotonics with electronics promises revolutionary applications ranging from light detection and ranging (LiDAR) to holographic displays. Although semiconductor manufacturing of nanophotonics in Silicon ... » read more

Applying Machine Learning to EDA, FPGA Design Automation Tools


A technical paper titled “Application of Machine Learning in FPGA EDA Tool Development” was published by researchers at the University of Texas Dallas. Abstract: "With the recent advances in hardware technologies like advanced CPUs and GPUs and the large availability of open-source libraries, machine learning has penetrated various domains, including Electronics Design Automation (EDA). E... » read more

Characterization, Modeling, And Model Parameter Extraction Of 5nm FinFETs


A technical paper titled “A Comprehensive RF Characterization and Modeling Methodology for the 5nm Technology Node FinFETs” was published by researchers at IIT Kanpur, MaxLinear Inc., and University of California Berkeley. Abstract: "This paper aims to provide insights into the thermal, analog, and RF attributes, as well as a novel modeling methodology, for the FinFET at the industry stan... » read more

Novel NVM Devices and Applications (UC Berkeley)


A dissertation titled “Novel Non-Volatile Memory Devices and Applications” was submitted by a researcher at University of California Berkeley. Abstract Excerpt "This dissertation focuses on novel non-volatile memory devices and their applications. First, logic MEM switches are demonstrated to be operable as NV memory devices using controlled welding and unwelding of the contacting electro... » read more

Estimating the Embedded Gate Resistance to Reproduce SiC MOSFET Circuit Performance (ROHM)


A technical paper titled “Improved Scheme for Estimating the Embedded Gate Resistance to Reproduce SiC MOSFET Circuit Performance” was published by researchers at ROHM Company. Abstract: "The intrinsic gate resistance ( Rg_in) , which is a novel resistance factor embedded in transistors, was determined for silicon carbide (SiC) metal–oxide–semiconductor field-effect transistors (MOSFE... » read more

Meeting The Material Challenges Of Nano-CMOS Electronics


A technical paper titled “Shockley-Read-Hall recombination and trap levels in In0.53 Ga0.47As point defects from first principles” was published by researchers at University of Glasgow and Synopsys Denmark. Abstract: "We present charge state transition levels of 23 intrinsic defects and dopant substitutions in the compound III-V semiconductor In0.53 Ga0.47 As, calculated with density func... » read more

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