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Ann Mutschler

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Ann Mutschler is senior executive editor at Semiconductor Engineering.

Author's Latest Posts

New Uses For Assertions
By Ann Mutschler - 24 Sep, 2020 - Comments: 0

Assertions have been a staple in formal verification for years. Now they are being examined to see what else they can be used for, and the list is growing. Traditionally, design and verification engineers have used assertions in specific ways. First, there are assertions for formal verification, which are used by designers to show when something is wrong. Those assertions help to pinpoint wh... » read more

Dealing With Device Aging At Advanced Nodes
By Ann Mutschler - 10 Sep, 2020 - Comments: 0

Premature aging of circuits is becoming troublesome at advanced nodes, where it increasingly is complicated by new market demands, more stress from heat, and tighter tolerances due to increased density and thinner dielectrics. In the past, aging and stress largely were separate challenges. Those lines are starting to blur for a number of reasons. Among them: In automotive, advanced-node... » read more

Formal Verification Becoming Critical To Auto Security, Safety
By Ann Mutschler - 09 Sep, 2020 - Comments: 0

Formal verification is poised to take on an increasingly significant role in automotive security, building upon its already widespread use in safety-critical applications. Formal has been essential component of automotive semiconductor verification for some time. Even before the advent of ADAS and semi-autonomous vehicles — and functional safety specifications like ISO 26262 and cybersecur... » read more

Challenges In Using AI In Verification
By Ann Mutschler - 27 Aug, 2020 - Comments: 0

Pressure to use AI/ML techniques in design and verification is growing as the amount of data generated from complex chips continues to explode, but how to begin building those capabilities into tools, flows and methodologies isn't always obvious. For starters, there is debate about whether the data needs to be better understood before those techniques are used, or whether it's best to figure... » read more

Preparing For A Barrage Of Physical Effects
By Ann Mutschler - 13 Aug, 2020 - Comments: 0

Advancements in 3D transistors and packaging continue to enable better power and performance in a given footprint, but they also require more attention to physical effects stemming from both increased density and vertical stacking. Even in planar chips developed at 3nm, it will be more difficult to build both thin and thick oxide devices, which will have an impact on everything from power to... » read more

Virtualization In The Car
By Ann Mutschler - 06 Aug, 2020 - Comments: 1

As the automotive industry grapples with complexity due to electrification and increasing autonomy of vehicles, consolidation of ECUs within vehicles, more stringent safety and security requirements, automotive ecosystem players are looking to virtualization concepts in a number of ways to realize the vehicles of tomorrow. One way is with hardware virtualization; the ability of a device such... » read more

Problems And Solutions In Analog Design
By Ann Mutschler - 05 Aug, 2020 - Comments: 1

Advanced chip design is becoming a great equalizer for analog and digital at each new node. Analog IP has more digital circuitry, and digital designs are more susceptible to kinds of noise and signal disruption that have plagued analog designs for years. This is making the design, test and packaging of SoCs much more complicated. Analog components cause the most chip production test failures... » read more

Pivoting Toward Safety-Critical Verification In Cars
By Ann Mutschler - 31 Jul, 2020 - Comments: 1

The inclusion of AI chips in automotive and increasingly in avionics has put a spotlight on advanced-node designs that can meet all of the ASIL-D requirements for temperature and stress. How should designers approach this task, particularly when these devices need to last longer than the applications? Semiconductor Engineering sat down to discuss these issues with Kurt Shuler, vice president of... » read more

Universal Verification Methodology Running Out Of Steam
By Ann Mutschler - 30 Jul, 2020 - Comments: 2

For the past decade or so, the Universal Verification Methodology (UVM) has been the de facto verification methodology supported by the entire EDA industry. But as chips become more heterogeneous, more complex, and significantly larger, UVM is running out of steam. Consensus is building that some fundamental changes are required, moving tools up a level of abstraction and making them more ag... » read more

EDA On Board With New Package Options
By Ann Mutschler - 22 Jul, 2020 - Comments: 2

A groundswell of activity around multi-die integration and advanced packaging is pushing EDA companies to develop integration strategies that speed up time to sign-off, increase confidence that a design will work as expected, while still leaving enough room for highly customized solutions. Challenges range from how to architect a design, how to explore the best options and configurations, ho... » read more

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