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Ann Mutschler

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Ann Mutschler is senior executive editor at Semiconductor Engineering.

Author's Latest Posts

Circuit Aging Becoming A Critical Consideration
By Ann Mutschler - 17 Jun, 2019 - Comments: 5

Circuit aging was considered somebody else's problem when most designs were for chips in consumer applications, but not anymore. Much of this reflects a shift in markets. When most chips were designed for consumer electronics, such as smart phones, designs typically were replaced every couple of years. But with the mobile phone market flattening, and as chips increasingly are used in automot... » read more

BiST Grows Up In Automotive
By Ann Mutschler - 12 Jun, 2019 - Comments: 0

Test concepts and methods that have been used for many years in traditional semiconductor and SoC design are now being leveraged for automotive chips, but they need to be adapted and upgraded to enable monitoring of advanced automotive systems during operation of a vehicle. Automotive and safety critical designs have very high quality, reliability, and safety requirements, which pairs pe... » read more

Training Tomorrow’s Chip Designers
By Ann Mutschler - 05 Jun, 2019 - Comments: 1

With technology advancing rapidly and the growing number of open R&D projects, there is an expanding need for qualified engineers. To make this possible, practical education needs to start much earlier than after graduation. One the best ways the EDA and semiconductor industry has embraced is encouraging engineering students to cooperate with experienced engineers, technologists and indu... » read more

Why IP Quality Is So Difficult To Determine
By Ann Mutschler - 30 May, 2019 - Comments: 0

Differentiating good IP from mediocre or bad IP is getting more difficult, in part because it depends up on how and where it is used and in part because even the best IP may work better in one system than another—even in chips developed by the same vendor. This has been one of the challenges with IP over the years. In many cases, IP is poorly characterized, regardless of whether that IP wa... » read more

In-Chip Monitoring Becoming Essential Below 10nm
By Ann Mutschler - 20 May, 2019 - Comments: 0

Rising systemic complexity and more potential interactions in heterogeneous designs is making it much more difficult to ensure a chip, or even a block within a chip, will functioning properly without actually monitoring that behavior in real-time. Continuous and sporadic monitoring have been creeping into designs for the past couple of decades. But it hasn’t always been clear how effective... » read more

Is ADAS The Edge?
By Ann Mutschler - 16 May, 2019 - Comments: 0

Debate is brewing over whether ADAS applications fall on the edge, or if they are better viewed squarely within the context of the automotive camp. There is more to this discussion than just semantics. The edge represents a huge greenfield opportunity for electronics of all sorts, and companies from the mobile market and from the cloud are both rushing to stake their claim. At this point the... » read more

The Growing Uncertainty Of Sign-Off At 7/5nm
By Ann Mutschler - 09 May, 2019 - Comments: 3

Having enough confidence in designs to sign off prior to manufacturing is becoming far more difficult at 7/5nm. It is taking longer due to increasing transistor density, thinner gate oxides, and many more power-related operations that can disrupt signal integrity and impact reliability.  For many years, designers have performed design rule checks as part of physical verification of the desi... » read more

Make Your Own Energy
By Ann Mutschler - 02 May, 2019 - Comments: 2

Regenerative braking and other forms of energy capture are becoming more popular and increasingly effective. What started as a way of increasing the range of electric or hybrid vehicles is now being applied to everything from green buildings to industrial robots. The automotive industry is still the main driver of this technology. The idea that braking can generate energy has been around for... » read more

IP Requires System Context At 6/5/3nm
By Ann Mutschler - 01 May, 2019 - Comments: 0

Driven by each successive generation of semiconductor manufacturing technology, complexity has reached dizzying levels. Every part of the design, verification and manufacturing is more complicated and intense the more transistors are able to be packed onto a die. For these reasons, the entire system must be taken into consideration as a whole – not just as individual building blocks as could ... » read more

Automotive, AI Drive Big Changes In Test
By Ann Mutschler - 25 Apr, 2019 - Comments: 0

Design for test is becoming enormously more challenging at advanced nodes and in increasingly heterogeneous designs, where there may be dozens of different processing elements and memories. Historically, test was considered a necessary but rather mundane task. Much has changed over the past year or so. As systemic complexity rises, and as the role of ICs in safety-critical markets continues ... » read more

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