Author's Latest Posts


Reducing Latency, Power, and Gate Count with Floating-Point FMA


Today’s digital signal processing applications such as radar, echo cancellation, and image processing are demanding more dynamic range and computation accuracy. Floating-point arithmetic units offer better precision, higher dynamic range, and shorter development cycles when compared with fixed-point arithmetic units. Minimizing the design’s time to market is more important than ever. Algori... » read more

Delivering Superior Throughput For EDA Verification Workloads


Perhaps no industry is more competitive than modern electronics manufacturing and chip design. As consumers, we take it for granted that electronic devices continue to get faster, cheaper, and more capable with each generation. From smart watches to industrial controls to electronic heart-rate monitors, electronics manufacturers are challenged to build smarter, more complex devices leveraging s... » read more

Delivering Superior Throughput for EDA Verification Workloads


Perhaps no industry is more competitive than modern electronics manufacturing and chip design. As consumers, we take it for granted that electronic devices continue to get faster, cheaper, and more capable with each generation. From smart watches to industrial controls to electronic heart-rate monitors, electronics manufacturers are challenged to build smarter, more complex devices leveraging s... » read more

A Method to Measure Die Pad Capacitance


This paper defines a method to measure the chip die pad capacitance using time delay reflectometry (TDR). This method is useful for measuring the low-value capacitance that is present at the end of a transmission line. In all protocol specifications, pad capacitance is an important electrical parameter to be measured because it directly affects the bandwidth. However, it is a challenge to me... » read more

Analog Reliability Analysis for Mission-Critical Applications


Rapidly increasing electrical content in automobiles is driving the need for revolution in analog integrated circuit (IC) design methodology. Compared to designing for consumer electronics, designing for mission-critical applications—industrial, medical, space, and automotive—requires a different approach to reliability analysis. We will explore how reliability analysis needs to change for ... » read more

Accelerating SoC Time To Market With Cloud-Based Verification


This paper discusses the growing use of cloud and hybrid cloud environments among semiconductor design and verification teams. The schedule and efficiency benefits seen by verification teams using cloud are specifically highlighted, due to the considerable compute requirements associated with verification of advanced node SoCs, and the significant impact verification has on the overall SoC proj... » read more

Cadence Cloud—The Future Of Electronic Design Automation


Design complexity and competitive pressures are driving electronics developers to seek innovative solutions to gain competitive advantage. A key area of investigation is applying the power of the cloud to electronic design automation (EDA) to dramatically boost productivity. Grounded in its long history of providing hosted design solutions (HDS) and internal experience with cloud-based design, ... » read more

Improving Test Coverage And Eliminating Test Escapes Using Analog Defect Analysis


While the analog and mixed-signal components are the leading source of test escapes that result in field failures, the lack of tools to analyze the test coverage during design has made it difficult for designers to address the issue. In this white paper, we explore the methodology for performing analog fault simulation of test coverage based on defect-oriented testing. In addition, we look at h... » read more

Backchannel Modeling And Simulation Using Recent Enhancements To The IBIS Standard


Recent enhancements to the upcoming IBIS standard now support backchannel training, enabling IBIS-AMI models to emulate this real-world SerDes behavior. AMI modelers now can incorporate backchannel algorithms into their IBIS-AMI models, automating the optimization of transmitter and receiver equalization settings in the same manner as their actual SerDes hardware devices. This saves system desi... » read more

Functional Safety Methodologies For Automotive Applications


Safety-critical automotive applications have stringent demands for functional safety and reliability. Traditionally, functional safety requirements have been managed by car manufacturers and system providers. However, with the increasing complexity of electronics involved, the responsibility of addressing functional safety is now propagating through the supply chain to semiconductor companies a... » read more

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