Author's Latest Posts

SEM Analysis Reveals Real Cause Of Chip Failure
By DELTA, a part of FORCE Technology - 08 Jul, 2019 - Comments: 0

When it comes to ASIC design, DELTA’s motto is “first time right”. When the first wafers from the wafer fab showed severe electrical malfunction, we were extremely frustrated. To investigate the failure, the design team started electrical characterization of prototypes. Overall, a short between power and ground was observed and furthermore RF inputs exhibited strange VI characteristics. T... » read more

X-ray Detects Hidden Failure Modes
By DELTA, a part of FORCE Technology - 11 Jun, 2019 - Comments: 0

Functional testing and visual examination using stereo microscopy are today's 'standard' quality control techniques for characterising yield and workmanship-related issues in IC fabrication and electronics assembly. Currently used test methodologies—such as IPC-TM-650—rely heavily on visual examination. The visual detection of defects can still be difficult, as samples need to be inspected ... » read more

Hidden Soldier Joints Inspection: 4 Case Studies
By DELTA, a part of FORCE Technology - 07 May, 2019 - Comments: 0

IC packaging technologies are becoming smaller and thinner. Ball grid array (BGA) packages were introduced some years ago in order to save space on the PCB, and are now widely used. To overcome the resulting problems with using optical microscopy as an inspection tool, the endoscope found its way into quality engineering departments. To read more, click here. » read more

X-Ray Reveals Wire Bonding And Field Failures
By DELTA, a part of FORCE Technology - 09 Apr, 2019 - Comments: 0

Wire bonding is widely used for first-level interconnection of semiconductor die to component leads or pads. It is vital that the interconnection corresponds to the product-specific bonding diagram and that the wire bonding is of an acceptable robustness and quality. X-ray technology is critical for ensuring both. To read more, click here. » read more

Home Automation IoT Company Cuts ASIC Testing Costs
By DELTA, a part of FORCE Technology - 12 Mar, 2019 - Comments: 0

digitalSTROM develops smart home automation solutions providing users with superior comfort and a whole new style of living. Based on proprietary ASIC and software, digitalSTROM’s solutions connect electrical household appliances through existing power lines and enable an intelligent home via light switches, free speaking using Amazon Echo, and other apps. Challenges At the heart of digit... » read more

Failure Analysis of a Product—Not Only a Component
By DELTA, a part of FORCE Technology - 12 Feb, 2019 - Comments: 0

Classic failure analysis (FA) technique generally deals with a single failed component in a complete product to detect the root cause of failure. This approach is inexpensive and less time-consuming. However, this may end up with a wrong interpretation of the product failure or overlooking the synergetic effect of different components related to the failure. This article is about a product on ... » read more

A Longer Life For LED Power Electronics
By DELTA, a part of FORCE Technology - 10 Dec, 2018 - Comments: 0

One of the greater challenges with LED lighting is the electronic driver’s robustness to normally occurring transients or power surges in the network. Many everyday examples have shown that the active electronics in the light sources find it hard to handle the effects in a use environment, in which incandescent bulbs and lamps with passive electronics have functioned fine for decades. A new p... » read more

5 Best Practices For Successfully Managing An ASIC Supply Chain
By DELTA, a part of FORCE Technology - 05 Nov, 2018 - Comments: 0

Managing an end-to-end ASIC supply chain is one of the primary challenges of chip projects. Not only is the process long and complex, but it involves multiple technologies, dependencies and stakeholders. In this paper, we've assembled five best practices to help you translate ASIC specifications into a final product through a smooth supply chain process, including: Avoid costly time-... » read more

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