Author's Latest Posts


Executive Outlook: Chiplets, 3D-ICs, and AI


Semiconductor Engineering sat down to discuss chiplets and the challenges of moving to 3D-ICs with Bill Mullen, Ansys fellow; John Ferguson, senior director of product management at Siemens EDA; Chris Mueth, senior director of new markets and strategic initiatives at Keysight; Albert Zeng, senior engineering group director at Cadence; Anand Thiruvengadam, senior director and head of AI product ... » read more

Optical Interconnectivity At 224 Gbps


AI is generating so much traffic that traditional copper-based approaches for moving data inside a chip, between chips, and between systems, are running out of steam. Just adding more channels is no longer viable. It requires more power to drive signals, and the distance those signals can travel without excessive loss is shrinking. Mike Klempa, product marketing specialist at Alphawave Semi, di... » read more

Problems In Testing AI Chips


As AI chips get larger, it becomes much harder to test them. Today, there can be as many as 22,000 pins on a 150mm² die, but in the future that number may increase to 80,000 pins. That creates a huge challenge for the fabs and the testers. Jack Lewis, chief technologist at Modus Test, talks about the intricacies of testing these complex devices, from maintaining contact with those pins even on... » read more

More Data, More Redundant Interconnects


The proliferation of AI dramatically increases the amount of data that needs to be processed, stored, and moved, accelerating the aging of signal paths through which that data travels and forcing chipmakers to build more redundancy into the interconnects. In the past, nearly all redundant data paths were contained within a planar chip using a relatively thick silicon substrate. But as chipma... » read more

Speeding Up Die-To-Die Interconnectivity


Disaggregating SoCs, coupled with the need to process more data faster, is forcing engineering teams to rethink the electronic plumbing in a system. Wires don't shrink, and just cramming more wires or thicker wires into a package are not viable solutions. Kevin Donnelly, vice president of strategic marketing at Eliyan, talks about how to speed up data movement between chiplets with bi-direction... » read more

Conversing With Your Dishwasher


What does "Error 22" mean on your smart appliance? Today, most people have to look it up on the internet, but that's about to change. John Weil, vice president and general manager for Synaptics IoT and Edge AI Processor business unit, talks about how AI can be inexpensively and efficiently utilized by mapping directly to a database using a natural language interface. Unlike today, that informat... » read more

Three-Way Race To 3D-ICs


Intel Foundry, TSMC, and Samsung Foundry are scrambling to deliver all the foundational components of full 3D-ICs, which collectively will deliver orders of magnitude improvements in performance with minimal power sometime within the next few years. Much attention has been focused on process node advances, but a successful 3D-IC implementation is much more complex and comprehensive than just... » read more

AI Drives Re-Engineering Of Nearly Everything In Chips


AI's ability to mine patterns across massive quantities of data is causing fundamental changes in how chips are used, how they are designed, and how they are packaged and built. These shifts are especially apparent in high-performance AI architectures being used inside of large data centers, where chiplets are being deployed to process, move, and store massive amounts of data. But they also ... » read more

What’s Changing In SerDes


SerDes is all about pushing data through the smallest number of physical channels. But when it comes to AI, more data needs to be moved, and it has to be moved more quickly. Todd Bermensolo, product marketing manager at Alphawave Semi, talks about the impact of faster data movement on the transmitter (more power) and on the receiver (gain and advanced equalization), how to ensure signal inte... » read more

First-Time Silicon Success Plummets


First-time silicon success is falling sharply due to rising complexity, the need for more iterations as chipmakers shift from monolithic chips to multi-die assemblies, and an increasing amount of customization that makes design and verification more time-consuming. Details from a new functional verification survey[1] highlight the growing difficulty of developing advanced chips that are both... » read more

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