Author's Latest Posts


The Evolution Of Pervasive Computing


The computing world has gone full circle toward pervasive computing. In fact, it has done so more than once, which from the outside may look like a more rapid spin cycle than a real change of direction. Dig deeper, though, and it's apparent that some fundamental changes are at work. This genesis of pervasive computing dates back to the introduction of the PC in 1981, prior to which all corpo... » read more

Security Risks In The Supply Chain


Semiconductor Engineering sat down to discuss security in the supply chain with Warren Savage, research scientist in the Applied Research Laboratory for Intelligence and Security at the University of Maryland; Neeraj Paliwal, vice president and general manager of Rambus Security; Luis Ancajas, marketing director for IoT security software solutions at Micron; Doug Suerich, product evangelist at ... » read more

Bridging Math And Engineering In ML


Steve Roddy, vice president of products for Arm’s Machine Learning Group, examines the intersection of high-level mathematics in the data science used in machine learning within area, speed, and power limitations, and how to bring these two worlds together with the least amount of disruption. » read more

EDA, IP Growth Surge


EDA and IP grew 8.9% in Q3 of 2019, according to a just-released report, indicating continued confidence in semiconductor growth. Total revenue was up 8.9% globally compared with the same period in 2018, but that number is deceptively low. Revenue in China, for example, increased 5.7% compared to the same quarter in 2018, despite trade restrictions on sales of any IP developed in the United ... » read more

CEO Outlook: 2020 Vision


The start of 2020 is looking very different than the start of 2019. Markets that looked hazy at the start of 2019, such as 5G, are suddenly very much in focus. The glut of memory chips that dragged down the overall chip industry in 2019 has subsided. And a finely tuned supply chain that took decades to develop is splintering. A survey of CEOs from across the industry points to several common... » read more

Scan Diagnosis


Jayant D’Souza, product manager at Mentor, a Siemens Business, explains the difference between scan test and scan diagnosis, what causes values in a scan test to change, how this can be used to hone in on the actual cause of a failure in a design, and how to utilize test hardware more efficiently. » read more

What Will AI Look Like In 10 Years?


There's no such thing as reverse in AI systems. Once they are let loose, they do what they were programmed to do — optimize results within a given set of parameters. But today there is no consistency for those parameters. There are no standards by which to measure how AI deviates over time. And there is an expectation, at least today, that AI systems will adapt to whatever patterns they di... » read more

Scaling, Packaging, And Partitioning


Prior to the finFET era, most chipmakers either focused on shrinking or packaging, but they rarely did both. Going forward, the two will be inseparable, and that will lead to big challenges with partitioning of data and processing. The key driver here, of course, is that device scaling no longer provides appreciable benefits in power, performance and cost. Nevertheless, scaling does provide ... » read more

Testing Autonomous Vehicles


Jeff Phillips, head of automotive marketing at National Instruments, talks about how to ensure that automotive systems are reliable and safe, how test needs to shift to adapt to continual updates and changes, and why this is particularly challenging in a world where there is no known right answer. » read more

How To Ensure Reliability


Michael Schuldenfrei, corporate technology fellow at OptimalPlus, talks about how to measure quality, why it’s essential to understand all of the possible variables in the testing process, and why outliers are no longer considered sufficient to ensure reliability. » read more

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