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Power Reduction In A Constrained World


Back when 40-28nm were new, leakage power for wireless designs dominated the optimization technology focus. This led to multiple VT optimization and power intent management for digital designs to minimize or shut off leakage. As wireless devices moved to FinFET nodes, dynamic power became dominant. As a result, optimization technology focus shifted to build up dynamic techniques to complement y... » read more

High Performance, Low Power, And Test: DFT’s Impact On System PPA And Safety


Back in the day, test was an afterthought in system design and implementation. It was a separate task that could be added to the end of a project schedule—essentially, a checkbox before sending a design for manufacture or during product qualification. Nowadays, test is no longer an afterthought, and we’ll see it continue to grow in importance. Safety-critical semiconductor applications h... » read more