Author's Latest Posts

HyperLynx
By Siemens EDA - 03 Apr, 2025 - Comments: 0

You gain the full power of HyperLynx when it is fully integrated as part of the Xpedition PCB design flow. Yet, it also interfaces with most PCB layout tools, allowing any engineer to quickly import and set up their PCB designs for analysis, regardless of their existing toolset. And because its progressive verification methodology analyzes a design in stages, HyperLynx locates issues earlier an... » read more

A Novel Approach For HW/SW Co-Verification
By Siemens EDA - 27 Mar, 2025 - Comments: 0

The complexity of system on chips (SoCs) continues to grow rapidly. Accordingly, new standards and methodologies are introduced to overcome these verification challenges. The Portable Test and Stimulus Standard (PSS) from Accellera is one of the standard examples used to pursue such challenges. In this paper we will show a methodology to use PSS to orchestrate the process of HW/SW co-verificati... » read more

New Innovative Way To Functionally Verify Heterogeneous 2D/3D Package Connectivity
By Siemens EDA - 12 Mar, 2025 - Comments: 0

Historically, IC package design has been a relatively simple task which allowed the die bumps to be fanned out to a geometry suitable for connecting to a printed circuit board. The package netlist was often captured by the package designer, typically using Excel to manually assign net names to the desired die bumps and BGA balls to achieve the intended connection. Modern package and interpos... » read more

Reversible Chain Diagnosis
By Siemens EDA - 11 Mar, 2025 - Comments: 0

For advanced technologies, the industry is seeing very complicated silicon defect types and defect distribution. One consequence is that scan chain diagnosis becomes more difficult. To improve the resolution of scan chain diagnosis, Tessent Diagnosis can use new scan chain test patterns to leverage a reversible scan chain architecture. This paper describes the novel scan chain architecture t... » read more

Shift Left With Calibre Pattern Matching
By Siemens EDA - 06 Mar, 2025 - Comments: 0

As integrated circuit (IC) designs become increasingly complex, early-stage verification is crucial to ensure productivity and quality in design processes. The "shift left" verification approach, enabled by Siemens’ Calibre nmPlatform, helps IC design teams to identify and resolve critical issues much earlier in the design cycle. As part of the shift left platform, Calibre Pattern Matching... » read more

A Novel Approach For Hardware-Software Co-Verification
By Siemens EDA - 26 Feb, 2025 - Comments: 0

The complexity of system on chips (SoCs) continues to grow rapidly. Accordingly, new standards and methodologies are introduced to overcome these verification challenges. The Portable Test and Stimulus Standard (PSS) from Accellera is one of the standard examples used to pursue such challenges. In this paper we will show a methodology to use PSS to orchestrate the process of HW/SW co-verificati... » read more

Beyond Simulation: Transforming Early IC Design With Insight Analyzer
By Siemens EDA - 13 Feb, 2025 - Comments: 0

Traditional verification methods are proving inadequate for addressing critical reliability challenges in today's increasingly complex integrated circuit (IC) designs. Modern IC design requires a proactive approach to verification that emphasizes early-stage analysis. The shift-left methodology enables earlier identification of potential design risks, addressing the complex challenges of IP blo... » read more

Beyond Simulation: Transforming Early IC Design With Insight Analyzer
By Siemens EDA - 06 Feb, 2025 - Comments: 0

Traditional verification methods are proving inadequate for addressing critical reliability challenges in today's increasingly complex integrated circuit (IC) designs. Modern IC design requires a proactive approach to verification that emphasizes early-stage analysis. The shift-left methodology enables earlier identification of potential design risks, addressing the complex challenges of IP blo... » read more

How Google And Intel Use Calibre DesignEnhancer To Reduce IR Drop And Improve Reliability
By Siemens EDA - 15 Jan, 2025 - Comments: 0

In the fast-paced world of semiconductor design, achieving both Design Rule Check (DRC) clean layouts and optimal electrical performance is crucial for minimizing design iterations, reducing time-to-market and ensuring product reliability. This paper explores how the Calibre DesignEnhancer (DE) analysis-based, signoff-quality EMIR solution helps design teams meet these challenges by enhancing p... » read more

Streaming Scan Network
By Siemens EDA - 14 Jan, 2025 - Comments: 0

Tessent Streaming Scan Network (SSN) is a system for packetized delivery of scan test patterns. It enables simultaneous testing of any number of cores with few chip-level pins, and reduces test time and test data volume. With SSN, DFT engineers have a true SoC DFT solution without compromises between implementation effort and manufacturing test cost. Challenges with DFT for complex SoCs The... » read more

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