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2017 Coverity Scan Report


Today, open source software (OSS) development is one of the primary driving forces of technological innovation. From artificial intelligence to the Internet of Things, autonomous driving, and cloud computing infrastructure, OSS plays a pivotal role in the evolution of a wide range of technologies. But what are the implications of its dominance? To answer this, we review what we’ve learn... » read more

CISO Research Identifies 4 Distinct Approaches To The Role


Every chief information security officer (CISO) is unique. They each have varying modes of operation that are influenced by long and distinguished careers. To understand CISO strategies and approaches, we decided to conduct a study. We gathered data in a series of extended in-person interviews with 25 CISOs with the goal of describing how a CISO’s work is organized and executed. To read mo... » read more

Achieving ISO 26262 Software Tool Confidence For Improved Automotive Functional Safety


Achieving ISO 26262 Software Tool Confidence for Improved Automotive Functional Safety The rapid adoption of advanced electronic systems in automobiles has prompted the automotive industry to develop the ISO 26262 functional safety standard to address the potential risks associated with failures in these systems. ISO 26262 is derived from the more general IEC 61508 standard and defines requirem... » read more

Who Needs OWASP?


A list of critical web application security vulnerabilities is a necessary risk management tool. Equally true is that each organization has a different set of vulnerabilities plaguing their applications. To complete a trifecta of fundamental truths, crowdsourced lists such as the OWASP Top 10 rarely reflect an individual organization’s priorities. Given these three points, many organizatio... » read more

Analyzing The Losses In Visually Lossless Compression Algorithms


Over the past few years there has been a remarkable progress in the quality of display devices, with 4K displays becoming the norm, and 8K and 10K displays following closely. However, this increase in quality has led to a tremendous increase in the amount of data being transmitted over display links. To meet these demands most display interfaces are now making use of compression. This white pap... » read more

Enabling Synchronized Hardware Software Debug With Verdi


Verdi HW SW Debug is an instruction-accurate embedded processor debug solution that offers fully synchronized views between hardware, as RTL or gate-level design models, and software, as C or assembly code enabling co-debug between RTL and software. To read more, click here. » read more

On-Chip Clock And Process Monitoring Using STAR Hierarchical System’s Measurement Unit


Functional safety is one of the most critical priorities for system-on-chips (SoCs) that are involved in automotive, aerospace and industrial applications. These requirements are driven by standards such as ISO 26262 and are the backbone of the design and testing of automotive ICs. Synopsys’ STAR Hierarchical System’s Measurement Unit helps ensure the accuracy of on-chip clock frequency and... » read more

Understanding How To Assess Tool Confidence Levels For ISO 26262


ISO 26262, the automotive functional safety standard, requires the assessment of software Tool Confidence Levels (TCLs). Some SoC designers are under the impression that all tools must be classified with a TCL1. In reality, the goal is to classify your tools accurately for your specific situation and use case. This white paper provides insight on assessing TCLs that are consistent with ISO 2626... » read more

Rapid Pattern Sequencing And Optimization With STAR Hierarchical System At STMicroelectronics


This white paper is the second in a series of two papers on STMicroelectronics’ experience with the Synopsys DesignWare STAR Hierarchical System. This white paper also provides insights on IEEE 1500 based network implementation, execution and analysis. It details the MASIS file’s pattern sequencing which is used for production tests and helps minimize test time. For the thermal sensor examp... » read more

STMicroelectronics’ Implementation Of The STAR Hierarchical System And IEEE 1500 Wrapping


This white paper discusses various IEEE 1500 architectures that STMicroelectronics has deployed using the Synopsys DesignWare STAR Hierarchical System test solution. STAR Hierarchical System allows users to optimize test time on system-on-chips that use multiple cores. The white paper provides guidelines on interface IP wrapping with IEEE 1500 to improve test time. In addition, it discusses the... » read more

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