Wael elManhawy

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Wael ElManhawy is a Lead Technical Marketing Engineer supporting Calibre LFD tools and technologies in the Design to Silicon division of Mentor, a Siemens Business. He has 20 years of experience in the EDA and semiconductor industries, with extensive knowledge of lithography processes, semiconductor manufacturing, and Calibre tools. ElManhawy received his M.Sc. in Device Modeling of Double Gate MOSFETs from Cairo University.

Author's Latest Posts

How To Speed Up LVS Verification

By Wael elManhawy - 26 Nov, 2024 - Comments: 0

Layout versus schematic (LVS) comparison is a crucial step in integrated circuit (IC) design verification, ensuring that the physical layout of the circuit matches its schematic representation. The primary goal of LVS is to verify the correctness and functionality of the design. Traditionally, LVS comparison is performed during signoff verification, where dedicated tools compare layout and sche... » read more

Fast LFD Flows With Pattern Matching And Machine Learning Can Deliver Higher-Yielding Designs Faster

By Wael elManhawy - 22 Aug, 2019 - Comments: 0

By Wael ElManhawy and Joe Kwan A lithographic (litho) hotspot is a defect on a wafer that is created during manufacturing by a combination of systematic process variation and resolution enhancement technology (RET) limitations. Litho hotspots typically represent severe yield detractors, so detecting and eliminating potential litho hotspots prior to manufacturing is crucial to achieving a com... » read more