Blog Review: Dec. 11

Arm’s Urmish Thakker investigates ways to make recurrent neural networks run on resource constrained devices with limited cache and compute resources by reducing the number of RNN computations, without the need to retrain the original RNN model.

Mentor’s Brent Klingforth digs into the challenges of designing rigid-flex PCBs and how advanced capabilities in modern tools, like awareness of stack-up regions and board stiffener requirements, can lead to more productive design.

Cadence’s Paul McLellan shares highlights from the recent Photonics Summit and Workshop with a look at combining RF and photonics design for 5G, plus Intel’s hybrid lasers for the data center.

Synopsys’ Taylor Armerding takes a look at some of the worst data breaches of the year by number of people affected, how the breach happened, and how they were discovered.

ANSYS’ Seth Binfield explains the chemistry of flux residue and the factors that can lead it to contribute to electrical failure of a board, plus how an assembly’s cleanliness can be measured.

Lam Research’s Nerissa Draeger celebrates the 150^th birthday of the periodic table with a look at its role in understanding chemistry, the importance of metalloids, and the growing number of elements used in the semiconductor industry.

SEMI’s Nishita Rao chats with Michael Holmes of Sandia on the national lab’s move from 6-inch to 8-inch wafers, plus new gold antennas for better thermal infrared radiation detection.

And don’t miss the blogs featured in the latest IoT, Security & Automotive and Test, Measurement & Analytics newsletters:

Editor In Chief Ed Sperling examines the aftermath of the internal combustion engine.

Rambus’ Gary Kenworthy reveals how secret information can be extracted from electronic systems.

Flex Logix’s Geoff Tate explains the different forms of inference at the edge and the outlook for the accelerator ecosystem.

Arteris IP’s Kurt Shuler warns that if we want to be serious about autonomous vehicles, the safety standard landscape needs to evolve beyond pass/fail checklists.

Mentor’s Jacob Wiltgen explains how earning the trust of a wary public remains one of the biggest hurdles for autonomous vehicles.

Synopsys’ Marc Serughetti stresses that auto electronics represent a significant opportunity for chip companies, but careful attention to ISO 26262 and current safety practices is essential.

Cadence’s Paul McLellan says if you can get your ship into orbit, you’re halfway to anywhere.

Editor In Chief Ed Sperling points to what’s really holding back quality improvements design and manufacturing.

Mentor’s Jeff Mayer shares how to reclaim lost profit margin with hybrid ATPG/LBIST test points.

OptimalPlus’ Kiki (Yitzhak) Ohayon warns that the increasing semiconductor content in today’s vehicles heightens their vulnerability to electronics-related failures, but current approaches don’t do enough to ensure reliability.

YieldHub’s Marie Ryan details the key advantages of using a yield management system, including better communication, faster time to market, and higher quality.

proteanTecs’ Eyal Fayneh describes how deep data analytics enable in-field HBM monitoring and repair.