Review of Automatic EM Image Algorithms for Semiconductor Defect Inspection (KU Leuven, Imec)


A new technical paper titled "Electron Microscopy-based Automatic Defect Inspection for Semiconductor Manufacturing: A Systematic Review" was published by researchers at KU Leuven and imec. Abstract: "In this review, automatic defect inspection algorithms that analyze Electron Microscope (EM) images of Semiconductor Manufacturing (SM) products are identified, categorized, and discussed. Thi... » read more

Energy Analysis: 2D and 3D Architectures with Systolic Arrays and CIM (Cornell)


A new technical paper titled "Energy-/Carbon-Aware Evaluation and Optimization of 3D IC Architecture with Digital Compute-in-Memory Designs" was published by researchers at Cornell University. "In this paper, we investigate digital CIM (DCIM) macros and various 3D architectures to find the opportunity of increased energy efficiency compared to 2D structures. Moreover, we also investigated th... » read more

Reactionary Or Anticipatory?


The EDA industry is located at an interesting place, where anticipation and reaction come together. Too much of either one is wasteful, but too little leaves the industry having to deal with unwanted problems. We see this happening in several areas today, and the balance is changing for several reasons. We normally expect universities to be 100% anticipatory. There is no point in them worki... » read more

Increasing Design Flexibility With RISC-V-Based Processor IP


The semiconductor industry increasingly needs more flexible and scalable processor architectures, driving the growing adoption of RISC-V. Originally developed at the University of California, Berkeley, the open-source RISC-V instruction set architecture (ISA) has become very popular in recent years. RISC-V allows designers to customize their processor implementations to meet the specific needs ... » read more

LLMs Show Promise In Secure IC Design


The introduction of large language models into the EDA flow could significantly reduce the time, effort, and cost of designing secure chips and systems, but they also could open the door to more sophisticated attacks. It's still early days for the use of LLMs in chip and system design. The technology is just beginning to be implemented, and there are numerous technical challenges that must b... » read more

Mini Review of Photodetectors and Image Sensors: Materials and Fabrication


A new technical paper titled "Image Sensors and Photodetectors Based on Low-Carbon Footprint Solution-Processed Semiconductors" was published by researchers at Cardiff University. Abstract "This mini-review explores the evolution of image sensors, essential electronic components increasingly integrated into daily life. Traditional manufacturing methods for image sensors and photodetectors, ... » read more

Chip Industry Week In Review


Arm joined forces with Korea's Samsung Foundry, ADTechnology, and Rebellions to create a CPU chiplet platform for AI training and inference. The new chiplet will be based on Samsung's 2nm gate-all-around technology. Intel and AMD, arch competitors for decades, formed an x86 ecosystem advisory group to collaborate on architectural interoperability and simplify software development. Samsung... » read more

Physics-Based Efficient Device Model for Fe-TFTs (Univ. of Florida)


A new technical paper titled "An efficient device model for ferroelectric thin-film transistors" was published by researchers at University of Florida. Abstract "Ferroelectric thin-film transistors (Fe-TFTs) have promising potential for flexible electronics, memory, and neuromorphic computing applications. Here, we report on a physics-based efficient device model for Fe-TFTs that effectivel... » read more

3D Device With BEOL-Compatible Channel And Physical Design for Efficient Double-Side Routing


A new technical paper titled "Omni 3D: BEOL-Compatible 3D Logic with Omnipresent Power, Signal, and Clock" was published by researchers at Stanford University, Intel Corporation, and Carnegie Mellon University. Abstract "This paper presents Omni 3D - a 3D-stacked device architecture that is naturally enabled by back-end-of-line (BEOL)-compatible transistors. Omni 3D arbitrarily interleaves ... » read more

Distributed Radar Signal Processing Utilizing A Sparse Array To Obfuscate The Data


A new technical paper titled "Signal processing architecture for a trustworthy 77GHz MIMO Radar" was published by researchers at Fraunhofer FHR, Ruhr University Bochum, and Wavesense Dresden GmbH. Abstract "Radar systems are used in safety critical applications in vehicles, so it is necessary to ensure their functioning is reliable and trustworthy. System-on-chip (SoC) radars, which are com... » read more

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