Author's Latest Posts

System-Level Testing – The New Paradigm for Semiconductor Quality Control
By Astronics - 05 Nov, 2018 - Comments: 0

Covering the history and trends of system-level test for semiconductors, this solution brief discusses: The increasing complexities of testing advanced semiconductor integrated devices across a span of applications: automotive, mobile computing, wearables, and more; Semiconductor trends driving necessary shifts in testing methodologies including SiP, SoC, 3D finFETs, heterogeneous compo... » read more

System-Level Test: Where Does It Fit?
By Astronics - 17 Sep, 2018 - Comments: 0

Our second C-Brief discusses where system-level test (SLT) best fits into your semiconductor test workflow. With automated testing equipment (ATE), a traditional workflow may consist of: Wafer sort (WS) Burn-in after packaging (BI) Combination of structural testing (ST) and functional testing (FT). As demands on high-volume manufacturing shift in response to wider industry and com... » read more

The Financial Justification For System-Level Test
By Astronics - 23 Jul, 2018 - Comments: 0

Three unique trends are currently transforming high-volume manufacturing in the semiconductor industry: The increasing complexity of chip architectures (e.g., FinFET, heterogeneous integration); The explosion in the breadth and ubiquity of consumer electronics (e.g. IoT, mobile, and automotive), and Consumer expectations of a constant stream of newer, cheaper, more advanced nodes. ... » read more

How Power, Lighting, And EVS Improve Rotorcraft Safety And Performance
By Astronics - 07 May, 2018 - Comments: 0

With rotorcraft serving rugged duty across a wide spectrum of mission-critical industries including firefighting, police work, emergency medical services (EMS), oil and gas transport, and search and rescue (SAR), integrating new technologies optimizes the safety and operational performance of the vehicle. Whether line-fit or retrofit, rotorcraft that operate in rugged, degraded environments dep... » read more

Astronics Test Systems And Tabor Electronics End Obsolescence For NAVAIR
By Astronics - 07 Aug, 2017 - Comments: 0

Obsolescence. This is not a favorite word for most end users. Flexibility, options, extended product life – those words bring relief to the testing environments of end users. Yet, nonetheless, obsolescence is a factor that must be faced within the testing industry. When the US Naval Air Systems Command (NAVAIR) faced obsolescence with a major Test & Measurement OEM, they turned to Astr... » read more

Massively Parallel System-Level Testing
By Astronics - 05 Jun, 2017 - Comments: 0

Decades of advances in the semiconductor industry continue to drive an insatiable consumer demand for smaller, more powerful, more ubiquitous devices – whether in our cars, on our countertops or around our wrists. To meet this demand now and into the future, the fabrication of increasingly complex semiconductor systems for an incredible spectrum of applications must scale accordingly. Additio... » read more

System-Level Testing
By Astronics - 10 Apr, 2017 - Comments: 0

This white paper on system-level testing for semiconductors. Covering the history and trends of system-level test for semiconductors, this solution brief discusses: The increasing complexities of testing advanced semiconductor integrated devices across a span of applications: automotive, mobile computing, wearables, and more; Semiconductor trends driving necessary shifts in testing method... » read more

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