System-Level Testing – The New Paradigm for Semiconductor Quality Control

How to close gaps in production level test and improve coverage to avoid failures.


Covering the history and trends of system-level test for semiconductors, this solution brief discusses:

  • The increasing complexities of testing advanced semiconductor integrated devices across a span of applications: automotive, mobile computing, wearables, and more;
  • Semiconductor trends driving necessary shifts in testing methodologies including SiP, SoC, 3D finFETs, heterogeneous components, and others;
  • The true costs of test escapes;
  • How to close the gap in production level test, and
  • New paradigms for creating cost-effective, 100% test coverage strategies to prevent expensive failures and recalls.

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