Ramsay Allen

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Ramsay Allen is a senior product marketing manager in the Synopsys EDA Group. Before joining Synopsys he was the marketing manager at Moortec Semiconductor Ltd, which developed embedded in-chip monitoring solutions. Moortec was acquired by Synopsys in November 2020 and integrated into Synopsys' SLM platform. He holds a BSc degree from the University of Plymouth.

Author's Latest Posts

Connection Perfection
By Ramsay Allen - 07 Nov, 2023 - Comments: 0

Whether you are a DFT engineer or a SoC designer, connectivity validation will no doubt be a top priority when taking steps to guarantee the functionality and reliability of your device. SoC designs continue to grow in both size and complexity to meet the ever-growing performance and power demands associated with modern technology. To keep up with this fast-paced evolution, the corresponding D... » read more

Ditch The Glitch
By Ramsay Allen - 11 Jul, 2023 - Comments: 0

To support the ever-growing performance demands of cutting-edge applications like automotive and hyperscaler, SoC complexity continues to increase. The emergence of multi-die technology has also compounded this complexity. To keep up with these demands, design-for-test (DFT) logic must also evolve to ensure greater levels of test robustness and silicon health. The “Shift left” concept which... » read more

Enabling SoC Visibility For Future Secure Hardware Architectures With In-Chip Environmental Monitoring
By Ramsay Allen - 07 Jun, 2022 - Comments: 0

Billions of people around the world are now online and generating vast amounts of data every day. This data revolution, which is largely driven by user performance requirements, is a double-edged sword. On one hand it is enabling huge technology advancements, revolutionizing the way we connect with each other and the world around us, but on the other hand it is exposing major vulnerabilities in... » read more

SLM Is Changing The Complete Device Lifecycle Process
By Ramsay Allen - 13 Sep, 2021 - Comments: 0

Amit Sanghani, Vice President of Engineering, HW-Analytics and Test Group at Synopsys, discusses how Silicon Lifecycle Management (SLM) is changing the way we look at the complete device lifecycle process and how it can enable heightened levels of visibility in device performance, reliability and security. Learn how SLM is well placed to address the challenges that occur at every stage of cut... » read more

In-Chip Sensing And PVT Monitoring: Not Just An Insurance Policy
By Ramsay Allen - 11 May, 2021 - Comments: 0

You wouldn’t drive an expensive car without insurance or take a flight in an aircraft without performing instrument and control surface checks. So why would you take the risk of designing a multi-million dollar advanced node semiconductor device without making sure you are aware of, and able to manage, the dynamic conditions that had the potential to make or break a silicon product? Advanced... » read more

How To Reduce Thermal Guard-Banding
By Ramsay Allen - 14 Feb, 2019 - Comments: 0

Accuracy in temperature sensors can have a big impact in designs from 40nm down to 7nm and beyond, reducing the amount of guard-banding that is required, which in turn can lower the power and extend the life and reliability of components. But at these process geometries, not all sensors measure temperature equally. Thermal guard-banding is a very important consideration for design teams, and... » read more

5 Reasons Why In-Chip Monitoring Is Here To Stay
By Ramsay Allen - 13 Sep, 2018 - Comments: 0

When the first car rolled off his production line in 1913, Henry Ford would have already envisioned just how prolific the automobile would become. However, would he have foreseen the extent to which monitors and sensors would become critical to the modern internal combustion engine? The requirement for energy efficiency, power performance and reliability in high volume manufactured vehicles ... » read more

Explaining Adaptive Voltage Scaling And Dynamic Voltage Frequency Scaling
By Ramsay Allen - 17 Jul, 2018 - Comments: 0

A Q&A with Moortec CTO Oliver King. What exactly do we mean by Adaptive Voltage Scaling versus Dynamic Voltage Frequency Scaling? Adaptive Voltage Scaling (AVS) involves the reduction of power by changing the operating conditions within an ASIC in a closed loop. Dynamic Voltage Frequency Scaling (DVFS), on the other hand, is a power management technique where the voltage is increased ... » read more

Process Detection & Variability
By Ramsay Allen - 14 Jun, 2018 - Comments: 0

A Q&A with Moortec CTO Oliver King. What do we mean by process variation? Process variation is a complex subject which covers a range of effects, but broadly we can consider that the effects are caused by imperfections in the manufacturing process. Examples are implant variations, mask misalignments, and optical variations. These all add up to give statistical variation on the ideal o... » read more

Supply Monitoring On 28nm & FinFET: The Challenges Posed
By Ramsay Allen - 12 Apr, 2018 - Comments: 0

A Q&A with Moortec CTO Oliver King. What are the issues with supplies on advanced nodes? The supplies have been coming down, quicker than the threshold voltages which has led to less supply margin. In addition to this, the interconnects are becoming thinner and closer together, which is pushing up resistance and also capacitance. What is the effect of these issues? In short, it... » read more

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