Author's Latest Posts


Monitor And Control Automotive Devices With Over-The-Air Updates


Modern vehicles are complex electronic devices that require regular over-the-air (OTA) system and software updates to ensure their correct and safe operation. This paper discusses the need for OTA and the Siemens solutions that ensure OTA updates are secure and meet all regulations and standards. To read more, click here. » read more

Enabling The Next Step In IC Test And Monitoring


Product lifecycle management (PLM) is a well-established concept across many industries that aims to manage the entire lifecycle of a product from inception through design, realization, deployment, and field service, right through to end-of-life activities such as final disposal. More recently, these principles are being applied by the semiconductor industry because electronics continue to p... » read more

Formal Verification Experiences


Several companies have used formal verification to perform silicon bug hunting. That is one of the most advanced usages of formal verification. It is a complex process that includes incorporating multiple sources of information and managing numerous success factors concurrently. This paper will present a “spiral refinement” bug hunt methodology that captures the success factors and guides t... » read more

Systematic Methodology To Solve Reset Challenges In Automotive SoCs


Modern automotive SoCs typically contain multiple asynchronous reset signals to ensure systematic functional recovery from unexpected situations and faults. This complex reset architecture leads to a new set of problems such as possible reset domain crossing (RDC) issues. The conventional clock domain and CDC verification methodologies cannot identify such critical bugs. In this paper, we prese... » read more

Exercising State Machines with Command Sequences


Almost every non-trivial design contains at least one state machine, and exercising that state machine through its legal states, state transitions, and the different reasons for state transitions is key to verifying the design’s functionality. In some cases, we can exercise a state machine simply as a side-effect of performing normal operations on the design. In other cases, the state machine... » read more

Nine Effective Features Of NVMe Verification IP For PCIe-Based SSD Storage


Non-Volatile Memory Express (NVMe) is a new software interface optimized for PCIe Solid State Drives (SSD). This paper provides an overview of the NVMe specification and examines some of its key features. We will discuss its pros and cons, compare it to other conventional technologies, and point out key areas to focus on during its verification. You will learn how NVMe Questa Verification IP... » read more

4 Horsemen Of Wire Harness Manufacturing


Growing demands for automotive electrical and electronic (E/E) features drive increased complexity in the wiring harnesses that carry power and data signals to components around the vehicle. As a result, the wire harness manufacturing industry is expected to see significant growth, expanding into a 91 billion dollar industry in 2025. However, wire harness manufacturers often operate on small pr... » read more

Surviving The Three Phases Of High Density Advanced Packaging Design


The growth of High Density Advanced Packages (HDAP) such as FOWLP, CoWoS, and WoW is triggering a convergence of the traditional IC design and IC package-design worlds. To handle these various substrate scenarios, process transformation must occur. This paper discusses the three phases of HDAP design and provides tips on how to survive their challenges. To read more, click here. » read more

Using AWS Cloud Services For IC Library Characterization That Is Scalable, Secure, And Fast


Siemens’ AMS Verification team and Amazon Web Services (AWS) have collaborated to provide users with a scalable, secure and cost-effective cloud characterization flow that enables users to leverage cloud computing resources to accelerate library characterization, reduce compute resource bottlenecks, as well as improve characterization runtime predictability. To read more, click here. » read more

Tessent LogicBIST With Observation Scan Technology


Meeting the ISO 26262 requirements for high quality and long-term reliability mans implementing on-chip safety mechanisms with high defect coverage of IC logic. This paper describes Observation Scan Technology, a new new logic built-in-self-test (BIST) technology that improves logic BIST test quality and reduces in-system test time. Empirical results demonstrate 90% test coverage with up to 10X... » read more

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