Author's Latest Posts


From Design To Deployment: How Silicon Lifecycle Management Optimizes The Entire IC Life Span


The beginning of the IC journey gets most of the attention in the semiconductor world – the challenges of design, test and manufacturing. But the reality is the entire lifecycle of a chip needs attention, requiring ways to ensure a chip’s intended and ongoing operation, especially in ever-changing operating environments where chips ultimately reside. The growing complexity of today’s e... » read more

It’s All About Staying Ahead Of The Test Challenges Curve


Since the early days when semiconductor devices contained a mere handful of gates, the manufacturing test world has been focused on how to detect the greatest number of potential defects in the shortest amount of time. This fundamental goal has not changed over the years and continues at 5nm and beyond. What has dramatically changed over the years, however, is the variety of techniques used ... » read more

How Automotive ICs Are Reshaping Semiconductor Test


The growth of a new IC market creates ripples along the entire supply chain. Today, we see the semiconductor industry reacting to the needs of the growing automotive IC market, including the development of new IC test tools and methods. The automotive IC market is far and away the fastest growing end-use market with 15% CAGR (according to IC Insights). It is also seeing many new players. Mar... » read more

Moving Automotive Test Into The Analog Domain


The amount of electronic content in passenger cars continues to grow rapidly, driven mainly by the integration of various advanced safety features. The industry’s move towards fully autonomous vehicles promises to even further increase the number of these safety features and consequentially, the electronic content required in each vehicle. Recent reports indicate that hundreds of semicondu... » read more

BIST For Low-Power Devices


By Stephen Pateras The persistent growth of mobile computing is driving an increasing need to manage power consumption within semiconductor devices. This has significant implications on the design and test of these devices. Low-power requirements affect test in two separate ways. First, it’s important to ensure that any functional power constraints are met (or at least adequately managed) du... » read more