Blog Review: April 12

Cadence’s Paul McLellan discusses the legal concerns around autonomous vehicles, emotion-based driver monitoring, and the role of LiDAR, from the CASPA Symposium on Autonomous Driving.

The IEEE Design & Test’s Magdy Abadir interviews Mentor’s Wally Rhines in a discussion ranging from EDA growth and its economics to the increasing complexity of verification.

Synopsys’ Robert Vamosi examines different ways automakers approach the need for both safe and secure software in cars.

ARM’s Govind Wathan explains the future of big.LITTLE and how it works with the company’s new heterogenous processing technology.

Rambus’ Aharon Etengoff checks out the unique PHY, chip and subsystem design challenges facing HBM2.

GlobalFoundries’ Rutger Wijburg shares steps the company is taking to increase production capacity at its 300mm Fab 1 in Dresden, Germany.

NXP’s Donnie Garcia warns of phishing scams using gifted IoT edge nodes as a lure.

Cadence’s Dave Pursley explains the value of using high-level synthesis when designing hardware for emerging standards.

Mentor’s John McMillan looks at how analog, RF, and MEMS work together in an IoT design.

Plus, don’t miss the blogs from this week’s newsletters, IoT, Security & Automotive and Packaging, Test & Electronic Systems:

Editor In Chief Ed Sperling examines the link between random defects and the design process.

Executive Editor Ann Steffora Mutschler finds that managing automotive systems is complicated by software and tracking requirements.

Mentor Graphics’ Brian Derrick digs into who has the upper hand in the auto industry of the future—startups or established companies.

Rambus’ Christopher Gori points out that side-channel attacks can defeat most cryptographic security solutions, but there are ways to protect against them.

Kilopass’ Paolo Piacentini observes that securing access to ECUs and the CAN bus is becoming a major focus in automotive.

Editor In Chief Ed Sperling argues that trying to fit everything into a discussion about Moore’s Law is getting ridiculous.

Technology Editor Jeff Dorsch examines years of change and consolidation in board test.

Optimal Plus’ David Park contends that big data is a necessary tool for cultivating product quality DNA, from the chip to the end device.

National Instruments’ David Vye digs into how the RF/microwave industry is changing to deal with the next generation of communications technology.