category: Chip, Package, System

category: Auto, Security & Edge AI

Scaling ADAS To 10+ Cameras
By WonBae Bang - 18 Jun, 2026 - Comments: 0

By WonBae Bang, KiDong Sim, Weilung Lu, and Adrian Arcedera Introduction Advanced Driver Assistance Systems (ADAS) are increasingly adopted by automotive manufacturers to enhance driving safety. These systems help drivers in the driving process, thereby increasing car and road safety. ADAS technologies include features such as adaptive cruise control, lane departure warning and automatic emer... » read more

Meeting High-Frequency And Power Density Challenges With Flip Chip MLF Packaging
By KyungSu Kim - 16 Apr, 2026 - Comments: 0

The relentless march of semiconductor scaling continues to reshape the packaging landscape, driven by Moore’s Law and the demand for higher performance in increasingly compact form factors [1]. Over the past two decades transistor density has increased exponentially, with leading-edge processes now achieving densities exceeding 100 million transistors per square millimeter. Certain applica... » read more

Quantifying The Impact Of Gravity On Strip Warpage Across Assembly Stages
By Nathan Whitchurch - 19 Mar, 2026 - Comments: 0

The mechanical behavior of electronic packages is an important consideration at each stage of the assembly process. Many packages are assembled in strip format, making strip warpage a critical challenge for manufacturability and yield. Accurate simulations for strip warpage are an effective tool to determine what factors cause large warpages and to explore solutions before assembly. In these si... » read more

Redefining Backside Metallization: Low‑Temperature Solutions For HDFO And S‑SWIFT Designs
By Dambi Jo - 19 Feb, 2026 - Comments: 0

As chip performance and integration continue to advance, thermal dissipation control has become increasingly critical not only at the wafer fabrication level but also in the packaging industry. For artificial intelligence (AI) and high performance computing (HPC) applications, the industry is gradually shifting toward 2.5D integration. In response to the growing demand, High-Density Fan-Out (HD... » read more

Unlocking Next-Gen Thermal Management: Why Indium-Based Metal TIMs Are Game-Changers
By JinSeon Min - 18 Dec, 2025 - Comments: 0

As electronic devices become more powerful and compact, thermal management has become one of the most critical challenges in advanced electronic packaging. High-performance processors used in AI computing, data centers, and 5G/6G infrastructure generate significant heat, and failure to dissipate effectively can lead to reduced performance, reliability issues, and even catastrophic component fai... » read more

Chiplet Integration and Testing: Key Lessons for Next-Gen Semiconductor Packaging
By Vineet Pancholi - 20 Nov, 2025 - Comments: 0

The Chiplet Era Has Arrived The floodgates for chiplet-based design have officially opened. Over the past several quarters, manufacturing test flows have been validating 2.5D package architectures, and production volumes are ramping up. These designs promise flexibility and performance, but they also introduce new test sensitivities—electrical, thermal, and mechanical—that challenge tradit... » read more

Enabling The Future: Heterogeneous Integration From Connected Devices To Data Centers
By WonChul Do - 23 Oct, 2025 - Comments: 0

The digital landscape is evolving at an unprecedented pace. From smartphones and wearables to autonomous vehicles and hyperscale data centers, the demand for faster, smarter, and more efficient electronics is reshaping the semiconductor industry. At the core of this transformation is heterogeneous integration—the convergence of multiple technologies, functions, and components into unified sys... » read more

Enhancing Clip Attach Vision Accuracy In Semiconductor Manufacturing
By Mahenthren Palaniappan - 18 Sep, 2025 - Comments: 0

In the semiconductor industry, the outsourced semiconductor assembly and test (OSAT) sector plays a pivotal role in the global technology landscape. As the backbone of electronic device manufacturing, OSAT companies are entrusted with the critical task of assembly, testing, and packaging of devices. Maintaining quality in OSAT operations is of paramount importance, as it directly impacts the pe... » read more

Engineering Reliable Heat Dissipation With Indium-Silver Thermal Interfaces
By MinJae Kong - 24 Jul, 2025 - Comments: 0

In recent years, rapid technological advancements in the field of high-performance computing have driven the development of increasingly sophisticated and powerful computing devices. This growth is expected to continue, with expansion into areas such as central processing units (CPUs), artificial intelligence (AI) systems, and automotive products. Flip chip lidded ball grid array (FCLBGA) pa... » read more

Maximizing Signal Integrity: Fine-Tuning Via Impedance In HDFO Architectures
By Tsung Ting Lee - 22 May, 2025 - Comments: 0

The most different aspect between a normal lamination structure and High-Density Fan-out (HDFO) is the routing scale. That aspect is also the challenge and focus of this study. At an HDFO scale, most of the electrical properties cannot be measured by instruments. Therefore, this study uses the indirect method to determine the impedance information of the via and match the impedance. Since the v... » read more

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