category: Test For The Autonomous Age

category: IoT, Security & Automotive

IoT Security By Design
By Lee Harrison - 08 May, 2025 - Comments: 0

After years of anticipation and steady uptake, the Internet of Things (IoT) seems poised to cross over into mainstream business use. The percentage of businesses utilizing IoT technologies has risen from 13% in 2014 to approximately 25% today. Global projections indicate that the number of IoT-connected devices is expected to reach 43 billion by 2030, nearly tripling from the figures in 2018. O... » read more

Shift Left In DFT Design
By Jeff Mayer - 08 Apr, 2025 - Comments: 0

The semiconductor industry continues to face numerous challenges as designs approach reticle limits, process nodes evolve and engineering resources become increasingly stretched. It is essential to maintain high productivity and quality throughout the design flow. This keeps projects on schedule, within budget, and ensures they remain high-quality, reliable, yield well and perform as intended. ... » read more

Unlocking The Value Of Yield
By Marc Hutner - 11 Mar, 2025 - Comments: 0

Have you stopped to consider the impact of yield on your overall product cost? Of course you did, when you considered your yield targets and set your product goals. But is it good enough to stop once the goals are achieved, or should you find ways to drive additional value into your organization once production has begun? What is the value of a 1% improvement in product yield? The short answer ... » read more

No-Compromise Packetized Test Improves DFT Efforts
By Peter Orlando - 14 Jan, 2025 - Comments: 0

Design for Test (DFT) managers often must make difficult and sometimes costly trade-offs between test implementation effort and manufacturing test cost. The traditional method for evaluating these trade-offs has been to use hierarchical DFT methods in a divide-and-conquer approach. In hierarchical DFT efforts, all implementation, including pattern generation and verification, is done at the cor... » read more

Improving Functional Safety For ICs
By Mohammed Abdelwahid - 10 Mar, 2020 - Comments: 0

The exponential growth of electronics in automobiles have stimulated significant innovation towards the development of advanced safety mechanisms. In addition to very high-quality manufacturing test, ICs for safety-critical applications need in-system test to detect faults and monitor circuit aging. Scan-based logic built-in-self-test (LBIST) is the technique used for in-system test, but tradit... » read more

An Optimal Path To DFT Automation
By Jay Jahangiri - 11 Feb, 2020 - Comments: 0

To keep up with time-to-market demands when SoCs keep increasing in size and complexity requires the adoption of better DFT flows and technologies. One of the most successful changes in design-for-test (DFT) flows in recent years has been the deployment of hierarchical DFT. Taking the divide-and-conquer approach delivers real savings in test time and cost, plus keeps DFT out of the critical pat... » read more

Planning Ahead For In-System Test Of Automotive ICs
By Jeff Mayer - 14 Jan, 2020 - Comments: 0

Automobiles are increasingly more like electronic devices than mechanical platforms. As a share of the total cost of a car, electronics components have grown from about 5% in 1970 to 35% in 2010. Electronics are projected to account for 50% by 2030 (Deloitte, 2019). Some of the electronics are for passive operations, like display or In-Vehicle Infotainment (IVI) systems, but a growing proportio... » read more

Squeezing Out More Test Compression
By Jeff Mayer - 10 Dec, 2019 - Comments: 0

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been quite effective at containing test costs. For many designs, standard test compressions is enough, but ICs for use in automotive and medical devices require a higher manufacturing test quality, which t... » read more

A Breakthrough In Silicon Bring-Up
By Matthew Knowles - 12 Nov, 2019 - Comments: 1

The current semiconductor market is seeing increasingly complex silicon devices for applications like 5G wireless communications, autonomous driving, and artificial intelligence. One of the ways designers are working to control design time and cost is through the adoption of IJTAG (IEEE 1687) for a plug-and-play style IP integration during design. The benefits of using IJTAG are still emerging,... » read more

The Single Best DFT Move You Can Make
By Jay Jahangiri - 08 Oct, 2019 - Comments: 0

A proven method to simplify a complex problem is to break it into smaller chunks. In the case of today’s large, complex SoCs, this means using hierarchical methods to design the blocks, then combine the results at the top level. While this sounds obvious, it hasn’t always been practical or technologically feasible to perform some tasks, like DFT, at the block level and translate that work s... » read more

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