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category: IoT, Security & Automotive

Production Testing For Silicon Photonics Wafers
By David Viera - 10 Aug, 2021 - Comments: 0

Worldwide data centers and networks for communications currently consume about 8% of the Earth’s total energy produced. To meet the increasing demands for cloud storage, computing, and various emerging applications such as artificial intelligence, genomics revolution, and video transcoding, hyperscale data centers are being built around the world at an accelerated pace, with analysts predicti... » read more

Cryostats Enable Astrophysics Research
By Paul Owen - 11 May, 2021 - Comments: 0

Imagine designing and building two prototype HPD cryostats for the Submillimeter Array on Maunakea in Hawaii. The SMA is a collaborative project between the Smithsonian Astrophysical Observatory (SAO, a member of the Center for Astrophysics | Harvard & Smithsonian) and the Academia Sinica Institute of Astronomy and Astrophysics. The SMA consists of eight radio telescopes operating fro... » read more

Testing VCSEL Devices On-Wafer
By Dan Rishavy - 09 Feb, 2021 - Comments: 0

Vertical-Cavity Surface-Emitting Lasers, or VCSELs, are seeing unparalleled demand, thanks to new uses for them in smartphone and automotive applications. 3D sensing for facial recognition is the key application in smartphones, with up to three VCSEL dies being integrated into a single phone. Emerging automotive applications such as driver monitoring, infotainment control and LiDAR will provide... » read more

Introduction To Test Data Formats
By Marie Ryan - 08 Dec, 2020 - Comments: 0

This blog is intended to provide an introduction to STDF and ATDF data formats. This is not intended to be definitive, only an introduction. If you are experienced with seeing data in spreadsheets and tables, then STDF is very different from what you are used to. Here we try to explain. STDF is the “Standard Test Data Format” developed jointly between some of the largest test equipment v... » read more

Picking The Right Location For Probe Stations
By Peter Andrews - 08 Dec, 2020 - Comments: 0

High performance flicker noise or phase noise TestCells can be degraded by installing them in a bad location. And just like developing a high-performance system, finding a good location can be a time consuming and difficult task for the typical lab technician that is tasked with setting up the new prober. To do it right requires specialized measurement equipment and tools such as accelerometers... » read more

High Throughput Noise Measurements
By Peter Andrews - 10 Nov, 2020 - Comments: 0

Flicker noise and random telegraph noise (RTN) testing can take a long time, especially when measuring down to frequencies of 1 Hz or below. Sweep times up to 30 min at a single temperature are common. And standard data collection for device models requires DUT data at multiple temperatures on small pads. To lower Cost of Test (CoT), and significantly increase on-wafer test throughput, a... » read more

Benefits Of Outsourcing Yield Management Software
By Marie Ryan - 10 Nov, 2020 - Comments: 0

Microchip is a longtime yieldHUB customer. We work with a number of divisions worldwide. We spoke to Kasia Metlička-Sawicka, an Engineering Release Supervisor, Senior Engineer II-Product in Microchip Ireland to find out why she likes using our system. What do you do? I’m an Engineering Release supervisor/Senior Product Engineer. I oversee the engineering release group of technicians... » read more

Sensors Will Proliferate In SoCs
By Tim Penhale-Jones - 15 Oct, 2020 - Comments: 0

No one likes being put on the spot, and yet we all like a forecast…and as we all know, the only guarantee with a forecast is that it is wrong. Sports commentators have carved out a special niche for themselves with the ‘commentators curse:’ just as they extol the virtues of an individual or a team, the sporting gods prove them wrong in spectacular fashion! Governments are no better: econo... » read more

Eliminating Ground-Loop Induced Noise
By Peter Andrews - 13 Oct, 2020 - Comments: 0

As semiconductor device performance increases, especially for low power and higher speed ICs, testing low frequency 1/f, RTN and phase noise with improved signal-to-noise ratio is required. Finding and eliminating unwanted noise is required in multiple areas. Noise sources can be found inside a prober, outside a prober, and in a measurement TestCell. Historically, TestCell-generated noise was o... » read more

Key Aspects Of Yield Management Systems For Fabless Startups
By Marie Ryan - 13 Oct, 2020 - Comments: 0

Do you work for a fabless start-up? Are you ramping up? If so, you need data-analysis tools for your production data. You will struggle without them. You have two options for yield management analysis. You may decide to hire an engineer (or team of engineers) whose job is to transfer the data from datalogs to a spreadsheet, then generate reports. Or, you could invest in a system that takes c... » read more

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