category: Videos

category: IoT, Security & Automotive

How To Ensure Reliability
By Ed Sperling - 13 Dec, 2019 - Comments: 0

Michael Schuldenfrei, corporate technology fellow at OptimalPlus, talks about how to measure quality, why it’s essential to understand all of the possible variables in the testing process, and why outliers are no longer considered sufficient to ensure reliability. » read more

Using Machine Learning To Break Down Silos
By Ed Sperling - 13 Nov, 2019 - Comments: 0

Jeff David, vice president of AI solutions at PDF Solutions, talks with Semiconductor Engineering about where machine learning can be applied into semiconductor manufacturing, how it can be used to break down silos around different process steps, how active learning works with human input to tune algorithms, and why it’s important to be able to choose different different algorithms for differ... » read more

How 5G Affects Test
By Ed Sperling - 11 Nov, 2019 - Comments: 0

David Hall, head of semiconductor marketing at National Instruments, talks with Semiconductor Engineering about architectural changes to infrastructure due to the rollout of 5G and how the move from macrocells to small cells is changing test requirements.         Subscribe to Semiconductor Engineering's YouTube Channel here » read more

Changes In Data Storage and Usage
By Ed Sperling - 09 Oct, 2019 - Comments: 0

Doug Elder, vice president and general manager of OptimalPlus, talks about what’s changing in the storage and collection, including using data lakes and data engineering to break down silos and get data into a consistent format, and why it’s essential to define data up front based upon how quickly it needs to be accessed, as well as who actually owns the data. » read more

New Challenges In Testing 5G Devices
By Ed Sperling - 07 Oct, 2019 - Comments: 0

Alejandro Buritica, senior solutions marketing manager at National Instruments, talks about what will be needed for mass-market testing of 5G devices, how to focus signals to overcome signal attenuation, and how to make over-the-air testing viable where leads are not exposed. » read more

Improving Quality Through Data Analytics
By Ed Sperling - 11 Sep, 2019 - Comments: 0

Doug Elder, vice president and general manager at OptimalPlus, explains how to utilize data to improve reliability, how it applies to different manufacturing processes, and what happens when that data is made available to more people within an organization. » read more

Ensuring A 5G Design Is Viable
By Ed Sperling - 09 Sep, 2019 - Comments: 0

Ron Squiers, network solutions specialist at Mentor, a Siemens Business, explains what’s different in 5G chips versus 4G, how to construct a front haul and back haul system so it is testable in the network stack. » read more

Using ML For Post-Silicon Validation
By Ed Sperling - 11 Jun, 2019 - Comments: 0

Ira Leventhal, vice president of Advantest’s new concept product initiative, talks about how to use machine learning to ferret out hidden relationships in a complex design and to utilize that data to improve chips. » read more

ATE Lab To Fab
By Ed Sperling - 05 Jun, 2019 - Comments: 2

Shu Li, business development manager at Advantest, zeroes in on the communication gap between engineers on the design side and the manufacturing/test side, why it exists, and what needs to be done to bridge that gap in order to speed up and improve test quality. https://youtu.be/Nd-5_twbJBw     See other tech talk videos here » read more

Making AI More Dependable
By Ed Sperling - 07 May, 2019 - Comments: 0

Ira Leventhal, vice president of Advantest’s new concept product initiative, looks at why AI has taken so long to get going, what role it will play in improving the reliability of all chips, and how to use AI to improve the reliability of AI chips themselves. » read more

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