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Harnessing The Power Of Data In Semiconductor Test


Every day, new methods are being developed to harvest, cleanse, integrate, and analyze data sources and extract from them useful, actionable intelligence to aid decision-making and other processes. This is true for a variety of industries, including semiconductor design, manufacturing, and test. Moore’s Law (figure 1) may be slowing with respect to traditional scaling of transistor critica... » read more

Driving Toward Predictive Analytics With Dynamic Parametric Test


The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify that wafers can be delivered to a customer. For IDMs, the test determines whether the wafers can be sent on for sorting. Usually inserted into the semiconductor manufacturing flow during wafer fabric... » read more