tag: IC design

IC Reliability Burden Shifts Left
By Ann Mutschler - 23 Jun, 2022 - Comments: 0

Chip reliability is coming under much tighter scrutiny as IC-driven systems take on increasingly critical and complex roles. So whether it's a stray alpha particle that flips a memory bit, or some long-dormant software bugs or latent hardware defects that suddenly cause problems, it's now up to the chip industry to prevent these problems in the first place, and solve them when they do arise. ... » read more

Best Practices For Deploying Cliosoft SOS On AWS
By Cliosoft - 01 Sep, 2021 - Comments: 0

Semiconductor Integrated Circuits (ICs) are at the center of a number of modern technological innovations. To keep up with the ever-increasing pace of innovation, IC design teams require robust, scalable design management (DM) solutions to enable seamless global collaboration and increase productivity. This eBook outlines the advantages of, and best practices, for deploying Cliosoft SOS design ... » read more

Rocky Road To Designing Chips In The Cloud
By Ann Mutschler - 24 Jun, 2021 - Comments: 0

EDA is moving to the cloud in fits and starts as tool vendors sort out complex financial models and tradeoffs while recognizing a potentially big new opportunity to provide unlimited processing capacity using a pay-as-you-go approach. By all accounts, a tremendous amount of tire-kicking is happening now as EDA vendors and users delve into the how and why of moving to the cloud for chip desig... » read more

Using Cliosoft SOS Design Management Platform In The Cloud
By Cliosoft - 31 Mar, 2021 - Comments: 0

In this eBook, we will talk about the various scenarios for how designers can leverage Cliosoft’s SoC design management platform in the cloud (Amazon Web Services and Google Cloud Platform) to successfully tapeout their SoCs. Click here to access the eBook. » read more

Utilizing More Data To Improve Chip Design
By Ann Mutschler - 28 Mar, 2019 - Comments: 0

Just about every step of the IC tool flow generates some amount of data. But certain steps generate a mind-boggling amount of data, not all of which is of equal value. The challenge is figuring out what's important for which parts of the design flow. That determines what to extract and loop back to engineers, and when that needs to be done in order to improve the reliability of increasingly com... » read more

Can Debug Be Tamed?
By Brian Bailey - 28 Feb, 2019 - Comments: 0

Debug consumes more time than any other aspect of the chip design and verification process, and it adds uncertainty and risk to semiconductor development because there are always lingering questions about whether enough bugs were caught in the allotted amount of time. Recent figures suggest that the problem is getting worse, too, as complexity and demand for reliability continue to rise. The... » read more

Using Memory Differently
By Ann Mutschler - 31 Jan, 2019 - Comments: 0

Chip architects are beginning to rewrite the rules on how to choose, configure and use different types of memory, particularly for chips with AI and some advanced SoCs. Chipmakers now have a number of options and tradeoffs to consider when choosing memories, based on factors such as the application and the characteristics of the memory workload, because different memory types work better tha... » read more

Bugs That Kill
By Brian Bailey - 23 Aug, 2018 - Comments: 3

Are simulation-resistant superbugs stifling innovation? That is a question Craig Shirley, president and CEO of Oski Technology, asked a collection of semiconductor executives over dinner. Semiconductor Engineering was invited to hear that discussion and to present the key points of the discussion. To promote free conversation, the participants, who are listed below, asked not to be quoted di... » read more

The “Last Simple Node” And the Internet of Things
By Brian Fuller - 17 Oct, 2013 - Comments: 0

Power, performance and size are key targets that will enable the expected explosion of the Internet of Things (IoT). Today, most observers see the path to that running directly through 16/14nm finFET and below for the node’s ability to manage power and size and boost integration. Geoff Lees isn’t your average observer. The vice president and general manager of Freescale’s microcon... » read more

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