A Lightweight Scan Instrumentation For Enhancing The Post-Silicon Test Efficiency in ICs (U. of Florida)


A technical paper titled "Enhancing Test Efficiency through Automated ATPG-Aware Lightweight Scan Instrumentation" was published by researchers at University of Florida. Abstract "Scan-based Design-for-Testability (DFT) measures are prevalent in modern digital integrated circuits to achieve high test quality at low hardware cost. With the advent of 3D heterogeneous integration and chiplet-b... » read more

Save Power And Area By Eliminating Redundant Resets


Resets initialize hardware by forcing it into a known state, either on design start up or to recover from an error. In today’s SoC designs, it is not uncommon to see designs with millions of registers that have resets. Unfortunately, many of these resets are redundant. Leaving these unnecessary register resets in the design leads to increased power consumption, excess area, and routing conges... » read more