tag: test equipment

MMAF Option Enables Picoampere Measurements
By Yoshiyuki Aoki - 12 Sep, 2023 - Comments: 0

By Yoshiyuki Aoki and Tsunetaka Akutagawa Demand for low-current devices is increasing, as many new sensors are being created for medical, automotive, industrial, and other applications. Chief among the heightened production and test requirements for these low-current devices is the need to achieve picoampere (pA)-class measurements. Sensors’ functionality and efficacy, especially in medic... » read more

Ensuring Your Semiconductor Test Equipment Is Protected From Rising Cybersecurity Threats
By Eli Roth - 06 Dec, 2022 - Comments: 0

Cybersecurity threats pose risks to your business every day and can attack every aspect of your operation, and these threats are only increasing. According to IBM Security’s Cost of a Data Breach Report, in 2021, the average total cost of a data breach increased by nearly 10% year over year, from $3.86M to $4.24M – the largest single year cost increase in the last seven years. Sourc... » read more

The Importance Of Product Burn-In Test
By Vineet Pancholi - 22 Jul, 2021 - Comments: 0

Product burn-in (BI) is an indispensable step in the production test flow to ensure good quality and a properly functioning product for the customer. Amkor takes pride in rating ‘quality delivered to the customer’ as one of the highest corporate virtues. See figure 1. Fig. 1: Defects per Million (DPM) and DPM goal reported over five years. Burned-in integrated circuits (ICs) have a ... » read more

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