Author's Latest Posts


Accurate Error Bit Mode Analysis Of STT-MRAM Chip With A Novel Current Measurement Module


Authors: (Advantest) Ryo Tamura, Ibuki Mori Naoyoshi Watanabe; (Tohoku University) Hiroki Koike, Tetsuo Endoh. A novel memory test system is needed for future STT-MRAM mass production that supports error bit analysis and its mode categorization on STT-MRAM chip measurement, as STTMRAM cell’s switching is a probabilistic phenomenon based on quantum mechanics. In order to meet this requireme... » read more

Next-Generation Vehicles Pose Automotive Semiconductor Test Challenges


Various market trends are driving requirements for automotive semiconductor test as technology increasingly defines the future of the automobile. According to IHS Markit, the total market for semiconductors, having reached nearly $500 billion in 2018, will grow at a CAGR of 4.88% through 2022, while the automotive electronics category, reaching more than $40 billion in 2018, will outpace the to... » read more

Speedier, More Accurate Testing of Automotive Sensors Is Here


The amount of electronic content in automobiles continues to grow at a brisk pace, and sensors represent a significant percentage of cars’ electronics. MarketsandMarkets estimates that the automotive sensors market alone will reach US$36.42 billion in value by 2023, at a compound annual growth rate (CAGR) of 6.7 percent between 2017 and 2023. Sensors in cars are used to monitor and control... » read more

5G Lessons Learned From Automotive Radar Test


Situated between microwave and infrared waves, the millimeter-wave spectrum is the band of spectrum between 30 gigahertz (GHz) and 300GHz. It is used for high-speed wireless communications and is widely considered as the means to bring 5G into the future by allocating more bandwidth to deliver faster, higher-quality video, and multimedia content and services. Automotive radar is the entry point... » read more