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Blog Review: July 10

Backward compatibility with eUSB2; endianness in embedded; preventing reactive power blackouts.

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Synopsys’ Eric Huang takes a look at how backward compatibility with USB 2.0 is provided when the IO voltages of new nodes can’t support 3.3V signaling and how eUSB2 can boost the signal and provide support for external or legacy peripherals.

In a video, Mentor Colin Walls explains endianness in embedded systems with a look at what it is, when it matters, and how to accommodate it in code.

Cadence’s Paul McLellan learns some of the broad considerations automakers are putting into development and deployment of autonomous driving, including safety, changing ownership models, and what the next 5-10 years look like.

ANSYS’ Sameer Kher takes a look at an effort to prevent blackouts caused by shortages of reactive power that keeps electric current flowing by using renewable energy sources combined with smart inverters that regulate the reactive power and voltage of power grids.

Rambus’ Paul Karazuba listens in to why security must start at the silicon level with a hardware root of trust as well as the inclusion of robust device provisioning systems into chip manufacturing in a talk by Neeraj Paliwal at the Global Semiconductor Alliance Silicon Summit.

Arm’s Nicola Logli points to some of the use cases for 5G, including immersive VR/AR and mobile gaming, health monitoring, and replacing public Wi-Fi networks.

And don’t miss the blogs featured in the latest Test, Measurement & Analytics newsletter:

Editor In Chief Ed Sperling observes that joint development of autonomous systems by carmakers is a necessary step, but what comes after that isn’t clear.

Mentor’s Mohammed Abdelwahid digs into test access and scheduling challenges in meeting ISO 26262 functional safety requirements even with a robust in-system test.

YieldHub’s John O’Donnell offers practical ideas that engineers use to reduce test time, especially if they have a good database for test data.

Delta’s Helle Ronsberg explains how to find failure sites that are hidden from optical view.

Optimal Plus’ Peter Hodgins demonstrates how to create automatic rules based on line data to proactively alert and react to problems before they result in scrap.

National Instruments’ Daniel Riedelbauch shares top automotive testing trends at the Automotive Testing Expo 2019.



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