Blog Review: May 8

Financial cybersecurity; mass metrology; AI and memory.


Synopsys’ Taylor Armerding warns that the threat of cyber war on the financial system is a real possibility and points to four major vulnerability concerns.

Cadence’s Meera Collier takes a look at bees and technology, from smart hives to sensors that can be carried on the insects’ backs.

Mentor’s Brent Klingforth argues that electrical and mechanic designers need to seamlessly share information with each other to ensure first pass success of complex electro-mechanical systems.

Lam Research’s Jiangtao Hu suggests mass metrology as a simpler, less expensive, and less time consuming way to improve process control for 3D device fabrication.

Arm’s Charlotte Christopherson highlights research into organic electrochemical transistors, which could be used as a biocompatible way to record electrophysical signals in the human body.

Applied Materials’ Mahendra Pakala considers the impact AI is having on new types of memory and architectures and why a hardware renaissance is on the horizon.

CEA-Leti’s Sergio Nicoletti explains the development of optical chemical sensors that can detect multiple environmental pollutants and are small enough to be integrated into mobile and wearable devices.

A Rambus writer considers the dangers of lax security processes as nearly a third of recently polled organizations admitted to shipping products with known security vulnerabilities.

Intel’s David Hoffman argues for stronger FTC regulations of data brokers in the wake of high-profile misuses of personal data that undermine public confidence in technology companies.

ANSYS’ Shawn Wasserman checks out a startup working to bring long-range wireless charging technology to industrial IoT sensors and some of the challenges it has faced.

Nvidia’s Daniel Saaristo points to the savings that can be generated by applying predictive maintenance that uses deep learning.

Plus, don’t miss the blogs featured in the latest IoT, Security & Automotive and Test, Measurement & Analytics newsletters:

Editor In Chief Ed Sperling finds growing concern about the safety of L3 and L4 autonomy in vehicles.

Rambus’ Bart Stevens examines how transient faults are used to attack chip security features and how to fight them.

Arteris IP’s Kurt Shuler asks how you manage when a subsystem needs to reboot in an autonomous vehicle.

Synopsys’ Melissa Kirschner highlights the six levels of driving automation and where we are now.

Mentor’s Richard Pugh and Gabriele Pulini describe what needs to be included in any comprehensive autonomous vehicle verification process.

Marvell’s Todd Owens explains the fundamental differences that help determine which low latency network protocol to use for your application.

Editor In Chief Ed Sperling contends that the next wave of data analytics will be less about infrastructure and more about leveraging patterns in data.

Advantest’s Judy Davies observes that as methods for additive manufacturing proliferate, in-house manufacturing is within the reach of even small companies.

Mentor’s Matthew Knowles shows how to improve yield and failure analysis by detecting, refining, clarifying and resolving defects inside standard cells.

Delta’s Yavuz Kose takes a deep dive into wet chemical decapsulation and why it is so important.

Optimal Plus’ Michael Schuldenfrei explains how to share product information with members of the supply chain without exposing your data.

National Instruments’ Luke Schreier warns that test systems must evolve to keep pace with advancements in technology while still supporting legacy assets.

Leave a Reply

(Note: This name will be displayed publicly)