Overview Of Security Verification Methodologies for SoC Designs Pre-Silicon (U. of Florida)


A technical paper titled "A Survey on SoC Security Verification Methods at the Pre-silicon Stage" was recently published by researchers at University of Florida. Abstract "This paper presents a survey of the state-of-the-art pre-silicon security verification techniques for System-on-Chip (SoC) designs, focusing on ensuring that designs, implemented in hardware description languages (HDLs) a... » read more

Characterizing Defects Inside Hexagonal Boron Nitride (KAIST, NYU, et al.)


A new technical paper titled "Characterizing Defects Inside Hexagonal Boron Nitride Using Random Telegraph Signals in van der Waals 2D Transistors" was published by researchers at KAIST, NYU, Brookhaven National Laboratory, and National Institute for Materials Science. Abstract: "Single-crystal hexagonal boron nitride (hBN) is used extensively in many two-dimensional electronic and quantu... » read more

New Approach to Encoding Optical Weights for In-Memory Photonic Computing Using Magneto-Optic Memory Cells


A new technical paper titled "Integrated non-reciprocal magneto-optics with ultra-high endurance for photonic in-memory computing" was published by researchers at UC Santa Barbara, University of Cagliari, University of Pittsburgh, AIST and Tokyo Institute of Technology. Abstract "Processing information in the optical domain promises advantages in both speed and energy efficiency over existi... » read more

Americas Chip Funding Energizes Industry


This is the second in a series of articles tracking government chip investments. See part one here (global),  part 3 covering EMEA is here and Asia here. Since the first announcement of a non-binding preliminary memorandum of terms with BAE Systems in December 2023, the U.S. Department of Commerce has rolled out comprehensive plans to support more than a dozen companies in order to shore up... » read more

Blog Review: Oct. 23


Cadence’s Sanjeet Kumar introduces the message bus interface in the PHY Interface for the PCIe, SATA, USB, DisplayPort, and USB4 Architectures (PIPE) specification, which provides a way to initiate and participate in non-latency-sensitive PIPE operations using a small number of wires. Siemens’ Dennis Brophy argues that the recently published Portable Test and Stimulus Standard (PSS) 3.0 ... » read more

Scalability of Nanosheet Oxide FETs for Monolithic 3-D Integration


A new technical paper titled "High-Field Transport and Statistical Variability of Nanosheet Oxide Semiconductor FETs With Channel Length Scaling" was published by researchers at The University of Tokyo and Nara Institute of Science and Technology. Abstract "We have investigated the scaling potential of nanosheet oxide semiconductor FETs (NS OS FETs) for monolithic 3-D (M3D) integration in t... » read more

Formally Modeling and Verifying CXL Cache Coherence (Imperial College London)


A new technical paper titled "Formalising CXL Cache Coherence" was published by researchers at Imperial College London. Abstract "We report our experience formally modelling and verifying CXL.cache, the inter-device cache coherence protocol of the Compute Express Link standard. We have used the Isabelle proof assistant to create a formal model for CXL.cache based on the prose English spec... » read more

Open-Source, Chiplet-Compatible RISC-V Controller


A new technical paper titled "ControlPULPlet: A Flexible Real-time Multi-core RISC-V Controller for 2.5D Systems-in-package" was published by researchers at ETH Zurich and University of Bologna. Abstract "The increasing complexity of real-time control algorithms and the trend toward 2.5D technology necessitate the development of scalable controllers for managing the complex, integrated oper... » read more

Research Bits: Oct. 22


3D-printed active electronics Researchers from MIT demonstrated fully 3D-printed semiconductor-free resettable fuses. Produced using standard 3D printing hardware and an inexpensive, biodegradable polymer filament doped with copper nanoparticles, the device can perform the same switching functions as the semiconductor-based transistors used for processing operations in active electronics. A... » read more

Review of Automatic EM Image Algorithms for Semiconductor Defect Inspection (KU Leuven, Imec)


A new technical paper titled "Electron Microscopy-based Automatic Defect Inspection for Semiconductor Manufacturing: A Systematic Review" was published by researchers at KU Leuven and imec. Abstract: "In this review, automatic defect inspection algorithms that analyze Electron Microscope (EM) images of Semiconductor Manufacturing (SM) products are identified, categorized, and discussed. Thi... » read more

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