Using cause-and-effect chains to debug IC designs.
This paper presents a new way to comprehend complex scenarios, in order to significantly accelerate bug detection and resolution. By defining a new visual language, which creates interaction vertices between the simulation scenarios and the code structure on a single matrix, we offer a novel way to compare multiple cycles. It enables verification engineers to reach solid conclusions regarding a failure by comparing successful events.
We propose a novel method that will significantly improve the cycle of failure detection. To read more, click here.
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