category: Blogs – PTES

category: IoT, Security & Automotive

Power-Supply Card Targets High-Voltage PMIC Test
By Toni Dircherl - 06 Jun, 2023 - Comments: 0

The electronics industry is seeing a move toward higher voltages and currents to deliver sufficient supply and charging power in products ranging from handheld cellphones and tablets to workstations. This trend is evidenced in examples such as the many USB power-delivery (PD) profiles with ratings ranging from 10W (5V at 2A for USB PD 3.0 profile 1) up to 100W (5V at 2A, 12V at 5A, and 20V at 5... » read more

Testing High Power Discrete Devices
By Tom Tran - 06 Jun, 2023 - Comments: 0

Emerging markets are driving the evolution of discrete power devices. Increased power requirements mean more power is being driven through a smaller device, creating challenges in both device design and test. This video series, 3 for 3, provides 3 answers for 3 pressing questions about trends in semiconductor test, and how testing for high power discrete devices is evolving. » read more

Five Smart Ways To Improve EV Battery Production
By Muge Deniz Meiller - 06 Jun, 2023 - Comments: 0

Batteries and battery management systems are the heart of today's electric vehicles. These components define the performance, safety, and driving range of more than 16.5 million1 electric vehicles currently on the road. As electric vehicle and battery manufacturers continue to look for ways to increase the efficiency and speed of their production processes, many turn to Nordson EFD for prec... » read more

The Ever-Increasing Role Of PVT Monitor IP And Its Significance In Silicon Lifecycle Management
By Rohan Bhatnagar - 05 Jun, 2023 - Comments: 0

The demand for semiconductor chips has grown exponentially over the years, driven by advancements in technologies such as artificial intelligence, the internet of things, 5G, automotive and cloud. With this increased demand, there is a growing need for more reliable semiconductor chips that can operate under extreme conditions and withstand the rigors of modern applications. Here are some of th... » read more

Addressing Yield Challenges In Advanced IC Substrate (AICS) Packaging
By Keith Best - 09 May, 2023 - Comments: 0

No matter how you get your news, it seems like everyone is talking about AI – and it’s either going to usher in a new era of productivity or lead to the end of humankind itself. Regardless, the AI era is here, and it’s just beginning to have an impact on our lives, our jobs and our future. To meet the rigorous demands of AI – along with high-performance compute, 5G and electric vehic... » read more

Data Analytics For The Chiplet Era
By Shinji Hioki - 09 May, 2023 - Comments: 0

This article is based on a paper presented at SEMICON Japan 2022. Moore’s Law has provided the semiconductor industry’s marching orders for device advancement over the past five decades. Chipmakers were successful in continually finding ways to shrink the transistor, which enabled fitting more circuits into a smaller space while keeping costs down. Today, however, Moore’s Law is slowin... » read more

Preventing Process Excursion With AI And Yield Management Software
By Krista Tropper - 09 May, 2023 - Comments: 0

Process excursion, or any deviation in a certain process, significantly impacts the cost of semiconductor manufacturing process and product yield. During production, process excursion can be detected early during in-line inspections. However, in some cases, excursion isn’t detected until later in the production process such as during wafer testing in the probing area after production. Apar... » read more

The Data Revolution Of Semiconductor Production
By Nitza Basoco - 09 May, 2023 - Comments: 0

During our insightful panel discussion on “The Data Revolution of Semiconductor Production – How Advancements in Technology Unlock New Insights,” we covered several topics including machine learning, edge computing and cloud-based data management. We discussed questions including: Are we creating the right data and doing enough with it? What needs to be done to make data actionable? Ho... » read more

Silicon Lifecycle Management Advances With Unified Analytics
By Guy Cortez - 25 Apr, 2023 - Comments: 0

In a typical day in the life of a product engineer, they have gone through the requisite wafer sort testing in manufacturing with the next step to assemble the resultant good die into their respective packages. While performing a series of parametric tests during final test, yield issues are encountered and the process of finding the source of the issues begins. Luckily, with access to a good d... » read more

What Is Achievable With A Yield Management System?
By Antonija Zagar - 12 Apr, 2023 - Comments: 0

Semiconductor manufacturers are under constant pressure to increase yields and cut costs. Yield Management Systems (YMS) are designed specifically to meet the needs of semiconductor manufacturers, enabling them to investigate yield excursions, streamline the manufacturing processes, optimize the supply chain, analyze tools and eliminate workplace inefficiencies. In terms of data challenges... » read more

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