The Growing Importance Of PMIC Validation


In the ever-evolving world of technology, the semiconductor industry plays a pivotal role in shaping the devices we use daily. Among the countless components that make up these devices, Power Management Integrated Circuits (PMICs) have emerged as unsung heroes, silently ensuring the efficient use of power resources. PMICs are specialized integrated circuits designed to manage and regulate th... » read more

Automotive Safety Requires PVT Monitoring IP Within Semiconductor ICs


The modern automobile, especially with the move toward more electrification, presents huge challenges to the designers of vehicular electronics. Gone are the days of mechanical issues and oil changes being primary concerns. Today’s automobile has a high number of semiconductor chips performing functions for self-driving autonomous systems, advanced driver assistance systems (ADAS), connectivi... » read more

Test Strategies In The Era Of Heterogeneous Integration


Moore’s Law, the observation that the number of transistors on an integrated circuit doubles approximately every two years, is critical to advances in computing technology. For decades, fabs have managed to achieve exponential growth in digital capability and transistor density by making transistors smaller and smaller, but we’ve hit the physical limits of these processes. Today, new proces... » read more

MMAF Option Enables Picoampere Measurements


By Yoshiyuki Aoki and Tsunetaka Akutagawa Demand for low-current devices is increasing, as many new sensors are being created for medical, automotive, industrial, and other applications. Chief among the heightened production and test requirements for these low-current devices is the need to achieve picoampere (pA)-class measurements. Sensors’ functionality and efficacy, especially in medic... » read more

3D NAND Needs 3D Metrology


By Nick Keller and Andy Antonelli You’ve read the reports: the memory market is floundering as the semiconductor industry moves through another scarcity/surplus cycle. Be that as it may, innovation is happening as the industry continues to pursue increasingly higher three-dimensional stacks, with 3D NAND stacks taller than 200 layers entering production. However, there are challenges... » read more

The Importance Of Efficient Low Power Validation In Electronics


In the fast-paced world of electronics, innovation is driven not only by cutting-edge features but also by energy efficiency. Low power validation has emerged as a critical aspect of electronics applications, playing a pivotal role in designing devices that are both sustainable and user-friendly. The rise of the Internet of Things (IoT) and wearable technologies has transformed the way we inter... » read more

Sustainable Products For A More Sustainable World


Teradyne’s sustainability journey began three decades ago with a focus on minimizing the environmental impact of our buildings and infrastructure, as outlined in our two part blog series (check out part one and part two). This effort also includes a focus on making our products more sustainable. In this blog, learn how Teradyne’s products and efforts are contributing to a more sustainabl... » read more

Reducing Chip Test Costs With AI-Based Pattern Optimization


The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested. The slower the test throughput, the more automatic test equipment (ATE) is needed to meet production throughput demands. This is a huge issue for chip producers, since high pin counts, blazingly ... » read more

Addressing Copper Clad Laminate Processing Distortion Using Overlay Corrections


All great voyages must come to an end. Such is the case with our series on the challenges facing the manufacturing of advanced IC substrates (AICS), the glue holding the heterogeneous integration ship together. In our first blog, we examined how cumulative overlay drift from individual redistribution layers could significantly increase overall trace length, resulting in higher interconnect res... » read more

How Software Can Help Redefine Semiconductor Validation


The rate of technological advancement is increasing faster than ever before. Although the demands for meeting aggressive time-to-market requirements and innovating at warp speed are not new, they are continuing to accelerate. To cut costs without compromising product quality, engineers are now expected to test new designs more rapidly at various stages of development. Even though many organizat... » read more

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