category: Blogs – PTES

category: IoT, Security & Automotive

Manufacturing ADAS Cameras Calls For Analytics
By Peter Hodgins - 09 Jul, 2019 - Comments: 0

Automotive camera design and manufacturing is one of the most difficult undertakings in hardware. Not only do you need to deal with the usual difficulties of high performance mechanical and electrical designs, but now highly specialized and sensitive optics are added into the equation. Complicating factors is that you won’t know how good the product is until it’s been completely assembled, ... » read more

Highlights From The Automotive Testing Expo 2019
By Daniel Riedelbauch - 09 Jul, 2019 - Comments: 0

Thousands of automotive engineers and enthusiasts visited the Automotive Testing Expo in Stuttgart, Germany, in May to see nearly 500 companies show off their latest technologies to test features such as active safety, vehicle electrification, and connectivity, among others. This blog features highlights of the expo and the Autonomous Vehicle Test and Development Symposium held in conjunction w... » read more

Thinking Differently About IIoT Analytics
By Michael Schuldenfrei - 17 Jun, 2019 - Comments: 0

Manufacturers are rushing to keep up with the latest technology trends and perhaps the most significant ones are around the smart factory. Whether you call it Industry 4.0, Smart Manufacturing or the Industrial Internet of Things (IIoT), what all these initiatives have in common is the desire to maximize value from manufacturing data and improve overall manufacturing efficiency. With the ave... » read more

Smart Plug-And-Play DFT For Arm Cores
By Ron Press - 11 Jun, 2019 - Comments: 0

Modern SoCs are experiencing continued growth in capabilities and design sizes with more and more subsystem IPs being implemented. These large, complex, multi-core SoCs need strategies for DFT and ATPG that effectively reduce DFT effort, minimize ATPG runtime, and still achieve the target test coverage. Hierarchical DFT enables designing and testing of these designs in a systematic and repeatab... » read more

Failure Analysis Of Electronic Devices Using Scanning Acoustic Microscopy
By Yavuz Kose - 11 Jun, 2019 - Comments: 0

Scanning acoustic microscopy, or SAM, is a non-destructive technique used in failure analysis of complex devices. SAM can provide a resolution down to sub-micron thicknesses. SAM is an efficient tool for analysis of adhesion between layers and presence of possible flaws in each layer. This can be used e.g. for investigations of sealing, coating, flip-chip underfills, BGA, QFN, wafer to wafer ... » read more

3D Metal Printing: Does It Add Up?
By Judy Davies - 07 May, 2019 - Comments: 0

Prolific Renaissance artist Michelangelo said, “The sculpture is already complete within the marble block before I start my work. ... I just have to chisel away the superfluous material.” I wonder what the great visionary would think of exchanging his chisel for an additive-manufacturing tool such as today’s 3D printers. 3D printing has been around since the 1980s, when it was first kn... » read more

Breakthrough For Scan Diagnosis With Machine Learning
By Matthew Knowles - 07 May, 2019 - Comments: 0

Cell-aware diagnosis is a new and effective way to detect defects inside standard cells. Industry standard failure analysis (FA) results from a major foundry show that cell-aware diagnosis is very effective at increasing the resolution of the diagnosis by reducing the number of suspects in cell-internal defect data. With advanced technology nodes, we have more complex layout structures and f... » read more

A Different Approach To Failure Analysis
By Yavuz Kose - 07 May, 2019 - Comments: 0

Decapsulation of plastic IC packages in different types and size were performed by wet chemical technique. Studied devices were to use in satellites and going to subject a series of test which require the die to be exposed. Different package types with changing sizes and bonding types such as Au- and Cu-bonded packages for unmounted and PCBA-mount components were successfully achieved. A combin... » read more

Data Sharing And Digital Threads
By Michael Schuldenfrei - 07 May, 2019 - Comments: 0

Electronics and the components that power them are more complex and advanced than ever. With these products an integral part of our daily lives, their reliability has become nothing less than mission-critical. As the demand for components accelerates, it is important that quality is not compromised under the pressure to meet quantity requirements. Otherwise we’re going to be seeing a lot of r... » read more

Modernizing Test In Aerospace And Defense
By Luke Schreier - 07 May, 2019 - Comments: 0

These days, you can’t attend a conference or have a conversation with leaders of the aerospace and defense community without touching on the modernization of the sector. This includes the integration of new technologies and processes to address aging equipment and fleets. The scale of the challenges in this space is too large, the costs are too high, and the impact of failure is too great to ... » read more

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