category: Low Power-High Performance

category: IoT, Security & Automotive

LPDDR Memory Is Key For On-Device AI Performance
By Nidish Kamath - 24 Jun, 2024 - Comments: 1

Low-Power Double Data Rate (LPDDR) emerged as a specialized high performance, low power memory for mobile phones. Since its first release in 2006, each new generation of LPDDR has delivered the bandwidth and capacity needed for major shifts in the mobile user experience. Once again, LPDDR is at the forefront of another key shift as the next wave of generative AI applications will be built into ... » read more

Powering Next-Generation Insightful Design
By Sara Louie - 24 Jun, 2024 - Comments: 0

The Ansys team is gearing up for an exciting time at DAC this week, where we’ll be sharing a whole new way of visualizing physical phenomena in 3D-IC designs, powered by NVIDIA Omniverse, a platform for developing OpenUSD and RTX-enabled 3D applications and workflows. Please attend our Exhibitor Forum session so we can show you the valuable design insights you can gain by interactively viewin... » read more

Research Bits: June 18
By Jesse Allen - 18 Jun, 2024 - Comments: 0

Gallium nitride can take the heat Researchers from Massachusetts Institute of Technology (MIT), the UAE's Technology Innovation Institute, Ohio State University, Rice University, and Bangladesh University of Engineering and Technology investigated the performance of ohmic contacts in a gallium nitride (GaN) device at extremely high temperatures, such as those that would be required for devices... » read more

IC Industry’s Growing Role In Sustainability
By Ann Mutschler - 17 Jun, 2024 - Comments: 1

The massive power needs of AI systems are putting a spotlight on sustainability in the semiconductor ecosystem. The chip industry needs to be able to produce more efficient and lower-power semiconductors. But demands for increased processing speed are rising with the widespread use of large language models and the overall increase in the amount of data that needs to be processed. Gartner estima... » read more

Why PCIe 7.0 Over Optics
By Keivan Javadi Khasraghi - 13 Jun, 2024 - Comments: 0

By Keivan Javadi Khasraghi and Ruben Sousa Data centers are currently facing the increasing need to enhance their bandwidth capacities. This surge is largely driven by the rise of new technologies, especially the growing demand for AI and machine learning applications. As these technologies advance, bandwidth requirements are projected to expand dramatically. As Large Language Models (LLMs) ... » read more

Validation Of Smart Sensors For AI-Based Condition Monitoring In Industry
By André Schneider - 13 Jun, 2024 - Comments: 0

By André Schneider and Martin Lehmann Industry has challenging requirements for the quality and reliability of the distributed smart sensors used in condition monitoring. As a result of digitalization and the increasing use of AI-based monitoring solutions, we can expect an increase in demand for systematic, efficient design and validation processes. In the future, a product’s journey fro... » read more

Temperature: A Growing Concern For Chip Security Experts
By Adam Kovac - 13 Jun, 2024 - Comments: 0

While everyone in the semiconductor industry wants to have the hottest new product, having that type of temperature manifest in a literal sense poses a threat not just to product stability and performance but to the security of the chips themselves. Temperature has become an object of fascination to security researchers due to the vagaries of how the physical properties of heat affect perfor... » read more

KANs Explode!
By Steve Roddy - 13 Jun, 2024 - Comments: 0

In late April 2024, a novel AI research paper was published by researchers from MIT and CalTech proposing a fundamentally new approach to machine learning networks – the Kolmogorov Arnold Network – or KAN. In the six weeks since its publication, the AI research field is ablaze with excitement and speculation that KANs might be a breakthrough that dramatically alters the trajectory of AI mod... » read more

Understanding Scandump: A Key Silicon Debugging Technique
By Vincent Yang - 13 Jun, 2024 - Comments: 0

Scandump is an advanced silicon debugging technique that ingeniously repurposes DFT (Design For Testability) scan chains for functional debugging. This method allows for the extraction of states from registers or latches that are stitched into the scan chains, providing critical diagnostic insights. Scandump is particularly invaluable when the CPU is deadlocked or when the system hardware bec... » read more

New Approaches Needed For Power Management
By Karen Heyman - 13 Jun, 2024 - Comments: 0

Power is becoming a bigger concern as the amount of data being processed continues to grow, forcing chipmakers and systems companies to rethink compute architectures from the end point all the way to the data center. There is no simple fix to this problem. More data is being collected, moved, and processed, requiring more power at every step, and more attention to physical effects such as he... » read more

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