A new technical paper titled "Warpage Study by Employing an Advanced Simulation Methodology for Assessing Chip Package Interaction Effects" was published by researchers at Siemens EDA, D2S, and Univ. Grenoble Alpes, CEA, Leti.
Abstract:
"A physics-based multi-scale simulation methodology that analyses die stress variations generated by package fabrication is employed for warpage study. The ...
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