category: Test, Measurement & Analytics

category: IoT, Security & Automotive

Data-driven Scheduling for High-mix and Low-volume Production in Semiconductor Assembly and Testing
By Technical Paper Link - 03 Nov, 2021 - Comments: 0

Abstract: The objective of this research is to improve scheduling decisions in high-mix low-volume (HMLV) production environments. Unique characteristics of HMLV semiconductor assembly and testing operations include: (1) Diversified Product Lines: To respond to global competition and different customer needs, manufacturers are providing diversified products to different consumers; (2) Unrelate... » read more

Convolutional Compaction-Based MRAM Fault Diagnosis
By Technical Paper Link - 03 Sep, 2021 - Comments: 0

Abstract: "Spin-transfer torque magnetoresistive random-access memories (STT-MRAMs) are gradually superseding conventional SRAMs as last-level cache in System-on-Chip designs. Their manufacturing process includes trimming a reference resistance in STT-MRAM modules to reliably determine the logic values of 0 and 1 during read operations. Typically, an on-chip trimming routine consists of mult... » read more

MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM
By Technical Paper Link - 03 Sep, 2021 - Comments: 0

Abstract: "Spin Transfer Torque Magnetic Random Access Memory (STT-MRAM) is one of the most promising candidates to replace conventional embedded memory such as Static RAM and Dynamic RAM. However, due to the small on/off ratio of MRAM cells, process variations may reduce the operating margin of a chip. Reference trimming was suggested as one of the ways to reduce variation impact to the chi... » read more

Intermittent Undefined State Fault in RRAMs
By Technical Paper Link - 03 Sep, 2021 - Comments: 1

Abstract: " Industry is prototyping and commercializing Resistive Random Access Memories (RRAMs). Unfortunately, RRAM devices introduce new defects and faults. Hence, high-quality test solutions are urgently needed. Based on silicon measurements, this paper identifies a new RRAM unique fault, the Intermittent Undefined State Fault (IUSF); this fault causes the RRAM device to intermittently c... » read more

Adaptive Test With Test Escape Estimation for Mixed-Signal ICs
By Technical Paper Link - 31 Dec, 2017 - Comments: 0

Abstract: The standard approach in industry for post-manufacturing testing of mixed-signal circuits is to measure the performances that are included in the data sheet. Despite being accurate and straightforward, this approach involves a high test time since there are numerous performances that need to be measured sequentially by switching the circuit into different test configurations. Adapt... » read more

What we know after twelve years developing and deploying test data analytics solutions
By Technical Paper Link - 31 Dec, 2016 - Comments: 0

Abstract: Since 2004, Texas Instruments and Portland State University have collaborated to develop and deploy test data analytical methods for use in a variety of applications, including quality screening, burn-in minimization, high cost test replacement and/or removal, and operations monitoring. In this paper, key findings amassed during this time are summarized. Find the technical paper h... » read more

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