category: Top Stories

category: IoT, Security & Automotive

Improving Performance And Power With HBM3
By Andy Patrizio - 30 Jan, 2023 - Comments: 0

HBM3 swings open the door to significantly faster data movement between memory and processors, reducing the power it takes to send and receive signals and boosting the performance of systems where high data throughput is required. But using this memory is expensive and complicated, and that likely will continue to be the case in the short term. High Bandwidth Memory 3 (HBM3) is the most rece... » read more

Choosing The Correct High-Bandwidth Memory
By Ann Mutschler - 25 Jan, 2023 - Comments: 0

The number of options for how to build high-performance chips is growing, but the choices for attached memory have barely budged. To achieve maximum performance in automotive, consumer, and hyperscale computing, the choices come down to one or more flavors of DRAM, and the biggest tradeoff is cost versus speed. DRAM remains an essential component in any of these architectures, despite years ... » read more

Design And Verification Methodologies Breaking Down
By Brian Bailey - 12 Jan, 2023 - Comments: 0

Tools, methodologies and flows that have been in place since the dawn of semiconductor design are breaking down, but this time there isn't a large pool of researchers coming up with potential solutions. The industry is on its own to formulate those ideas, and that will take a lot of cooperation between EDA companies, fabs, and designers, which has not been their strong point in the past. It ... » read more

Will Floating Point 8 Solve AI/ML Overhead?
By Karen Heyman - 12 Jan, 2023 - Comments: 2

While the media buzzes about the Turing Test-busting results of ChatGPT, engineers are focused on the hardware challenges of running large language models and other deep learning networks. High on the ML punch list is how to run models more efficiently using less power, especially in critical applications like self-driving vehicles where latency becomes a matter of life or death. AI already ... » read more

Growing System Complexity Drives More IP Reuse
By Ann Mutschler - 12 Jan, 2023 - Comments: 1

IP reuse of both third-party and internal IP is growing, but it's also becoming more complex to manage. There is more IP being used, and more systems into which it needs to be integrated, combined with other IP, and tracked throughout an organization. In some cases, this is an economic requirement. In others, designs are so complex that engineering teams need to focus on where they will make... » read more

3D-IC Reliability Degrades With Increasing Temperature
By Ann Mutschler - 14 Dec, 2022 - Comments: 0

The reliability of 3D-IC designs is dependent upon the ability of engineering teams to control heat, which can significantly degrade performance and accelerate circuit aging. While heat has been problematic in semiconductor design since at least 28nm, it is much more challenging to deal with inside a 3D package, where electromigration can spread to multiple chips on multiple levels. “Be... » read more

Variability Becoming More Problematic, More Diverse
By Karen Heyman - 12 Dec, 2022 - Comments: 0

Process variability is becoming more problematic as transistor density increases, both in planar chips and in heterogeneous advanced packages. On the basis of sheer numbers, there are many more things that can wrong. “If you have a chip with 50 billion transistors, then there are 50 places where a one-in-a-billion event can happen,” said Rob Aitken, a Synopsys fellow. And if Intel’s... » read more

IC Stresses Affect Reliability At Advanced Nodes
By Ann Mutschler - 08 Dec, 2022 - Comments: 1

Thermal-induced stress is now one of the leading causes of transistor failures, and it is becoming a top focus for chipmakers as more and different kinds of chips and materials are packaged together for safety- and mission-critical applications. The causes of stress are numerous. In heterogeneous packages, it can stem from multiple components composed of different materials. “These materia... » read more

Challenges With Adaptive Control
By Brian Bailey - 08 Dec, 2022 - Comments: 0

Historically, the performance and power consumption of a system was controlled by what could be done at design time, but chips today are becoming a lot more adaptive. This has become a necessity for cutting edge nodes, but also provides a lot of additional benefits at the expense of greater complexity and verification challenges. Design margins are a tradeoff between performance and yield. C... » read more

Improving Chip Efficiency, Reliability, And Adaptability
By Ed Sperling - 08 Dec, 2022 - Comments: 0

Peter Schneider, director of Fraunhofer Institute for Integrated Circuits' Engineering of Adaptive Systems Division, sat down with Semiconductor Engineering to talk about new models and approaches for ensuring the integrity and responsiveness of systems, and how this can be done within a given power budget and at various speeds. What follows are excerpts of that conversation. SE: Where are y... » read more

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