How to improve scan diagnosis in less time.
Performing volume scan diagnosis on today’s large, advanced node designs puts demands on turn-around-time and compute resources. This paper describes a new technique to maximize diagnosis throughput while performing ever more demanding scan diagnosis. The dynamic partitioning technology in Tessent Diagnosis enables in a 50% reduction in scan diagnosis time using only 20% of the typical memory. This new dynamic partitioning technology makes a larger volume of scan diagnosis results available much faster, increasing the overall throughput of failure diagnosis by 10X.
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