How to catch critical errors that result in manufacturing defects.
Traditional SRAM verification flows can require significant resources to implement and support, and still miss critical errors that result in manufacturing defects. Using the Calibre Pattern Matching automated pattern-based solution provides accurate results, avoids costly mask re-spins, and is easily updated to add newly developed SRAM IP cells.
To read more, click here.
 |
 |
 |
 |
 |
 |
 |  |
Leave a Reply