Best practices to statistically sample and predict how a device will operate over time.
When IC devices are produced and shipped to end customers, it is important that they will function as specified in the application environment. This paper outlines strategies and practices used to statistically sample, and predict how a device will operate over time. The practices outlined are believed to be best in class techniques for a successful product launch. These strategies most likely will point to sensitivities in devices that cause intermittent failures or process weaknesses which cause hard failures. If all of the outlined methods are not done in the preproduction phase, it may be necessary for failures to be analyzed later to prevent such occurrences in the future.
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