Redefining analog fault simulation for automotive functional safety and test coverage analysis.
The growth in safety-critical applications has ushered in a paradigm shift in automotive IC functional safety and test coverage analysis. The increased need for safety, low defect rate, and long-term reliability is driving automotive IC designers to augment expert judgment with systematic fault simulation, to ensure a high degree of confidence in their analysis and to comply with the stringent automotive standards. However, they are unable to perform fault simulation campaigns at the subsystem and full-chip level due to simulator performance and capacity constraints. Synopsys TestMAX CustomFault™ is a new simulator that features industry-leading CustomSim™ and FineSim® simulation technology and Adaptive Weighted Random Sampling (AWRS) technology to deliver unparalleled analog fault simulation performance, enabling subsystem and full-chip- level analog fault simulation. Synopsys has partnered with industry leaders to develop a solution that is tailored to meet the needs of the automotive industry.
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Author: Anand Thiruvengadam, Senior Manager, Product Marketing, Design Group
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