Field Testing In 5G NR

By Keysight - 21 Dec, 2023 - Comments: 0

5G NR network coverage measurements will be beam-based instead of cell-based. This will change the methodology of coverage KPI calculation. The amount of reference signals in the air is increasing as there will be multiple reference beams per cell, posing more stringent performance requirements for scanning receivers and test UEs. Both test UEs and scanners will be needed for 5G NR field verifi... » read more

Accelerate 5G Testing

By Keysight - 29 Nov, 2023 - Comments: 0

The promise of 5G is faster and more reliable communications. To enable mobile broadband communications, 5G uses existing and new technologies to achieve extreme data throughputs. In this white paper, you will learn about the impact of the 3GPP evolution on your testing and solutions available to help you scale to production quickly. Click here to read more. » read more

Logic Chip, Heal Thyself

By Susan Rambo And Ed Sperling - 11 Feb, 2020 - Comments: 0

If a single fault can kill a logic chip, that doesn’t bode well for longevity of complex multi-chip systems. Obsolescence in chips is not just an industry ploy to sell more chips. It is a fact of physics that chips don’t last more than a few years, especially if overheated, and hit with higher voltage than it can stand. The testing industry does a great job finding defects during manufac... » read more

The Growing Challenges Of 5G Reliability

By Susan Rambo - 10 Dec, 2019 - Comments: 0

The test field is getting more complicated as chips become larger, more heterogeneous, and subject to almost constant changes. Nowhere is this more evident than in 5G, where standards are still evolving and use cases are still being defined. Without passing test, no technology advances. But those definitions are subject to change, and they can change again over time. The communications in... » read more

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Entities, people and technologies explored

Shift Left Is The Tip Of The Iceberg

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Partitioning In The Chiplet Era

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3.5D: The Great Compromise

Pros and cons of a middle-ground chiplet assembly that combines 2.5D and 3D-IC.

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eBook: Nearly everything you need to know about memory, including detailed explanations of the different types of memory; how and where these are used today; what's changing, which memories are successful and which ones might be in the future; and the limitations of each memory type.

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tag: 5G testing

Field Testing In 5G NR

Accelerate 5G Testing

Logic Chip, Heal Thyself

The Growing Challenges Of 5G Reliability