tag: aging

Does Power Verification Work?
By Brian Bailey - 10 May, 2018 - Comments: 1

Functional verification continues to evolve, but power verification—a somewhat new concern—remains at levels of sophistication reminiscent of functional verification 30 years ago. When will power verification catch up and what must to happen to make it possible? These are questions that the industry is still grappling with, and not everyone believes they require answers. Functional error... » read more

Tech Talk: Electrical Overstress
By Ed Sperling - 12 Apr, 2018 - Comments: 0

ANSYS Chief Technologist João Geada talks about electrical overstress and circuit aging and how what it means for automotive electronics. https://youtu.be/4bjdr0uvWG4 » read more

Multiphysics Reliability Signoff For Next-Gen Auto Electronics Systems
By Annapoorna Krishnaswamy - 12 Mar, 2018 - Comments: 0

The automotive industry is in the midst of a sea change. Growing market needs for electrification, connectivity on the go, advanced driver assistance systems, and ultimately the goal of autonomous driving, are creating newer requirements and greater challenges. A chassis on four wheels is now fitted with cameras, radar and other sensors, which will be the eyes of the driverless car, as well as ... » read more

Chip Aging Accelerates
By Ed Sperling - 14 Feb, 2018 - Comments: 1

Reliability is becoming an increasingly important proof point for new chips as they are rolled out in new markets such as automotive, cloud computing and industrial IoT, but actually proving that a chip will function as expected over time is becoming much more difficult. In the past, reliability generally was considered a foundry issue. Chips developed for computers and phones were designed ... » read more

Tech Talk: 7nm Thermal Effects
By Ed Sperling - 14 Sep, 2017 - Comments: 0

ANSYS' Karthik Srinivasan talks about the effect of heat on reliability at advanced process nodes, including self-heating, circuit aging, and how that will affect automotive electronics. https://youtu.be/SS6iAXp0Kn8   Related Tech Talk: 7nm Power Dealing with thermal effects, electromigration and other issues at the most advanced nodes. » read more

Transistor Aging Intensifies At 10/7nm And Below
By Ann Mutschler - 13 Jul, 2017 - Comments: 0

Transistor aging and reliability are becoming much more troublesome for design teams at 10nm and below. Concepts like ‘infant mortality’ and 'bathtub curves' are not new to semiconductor design, but they largely dropped out of sight as methodologies and EDA tools improved. To get past infant mortality, a burn-in process would be done, particularly for memories. And for reliability, which... » read more

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